Development of X-ray fluorescence holography method for determination of local atomic environment

X-ray fluorescence holography (XFH) is a promising method for determination of a local environment around a particular element. Since the holographic signal is about 0.1 % of the background isotropic fluorescent radiation, it takes few months to record a set of complete XFH data using a conventional fluorescence detector such as a solid state detector. In order to overcome this difficulty, we designed an XFH setup using a toroidally bent graphite analyzer with large solid acceptance and an avalanche photo diode (APD). Fluorescence photons from a sample were focused by the graphite analyzer and detected at high counting rate (similar to 10(6) cps) by the APD. With this XFH setup, collection of high quality hologram data of a copper single crystal has been achieved within 2.5 hrs.