Fault Diagnosis of Joint Bayesian Method and LDA Feature Extraction in Complicated Industrial Process

被引:0
作者
Zhu, Wenbing [1 ]
Huang, Guangzao [1 ]
Guan, Jinting [1 ]
Ji, Guoli [1 ]
Zhou, Sun [1 ]
机构
[1] Xiamen Univ, Dept Automat, 422 Siming South Rd, Xiamen 361005, Fujian, Peoples R China
来源
2016 5TH INTERNATIONAL SYMPOSIUM ON NEXT-GENERATION ELECTRONICS (ISNE) | 2016年
关键词
Bayesian diagnosis; linear discriminant analysis; feature extraction; Tennessee Eastman Challenge;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Bayesian method is a class of data-driven fault diagnosis method which is a topic of significant practical interest. In order to improve diagnosis accuracy and reduce computation load, linear discriminant analysis (LDA) is employed to extract features before performing Bayesian diagnosis. It can maximize the explicit function to achieve the goal that within-class data points as close as possible and between-class data points as far as possible. Tennessee Eastman Challenge (TE) is utilized to verify the effectiveness of the proposed method.
引用
收藏
页数:3
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