Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition

被引：15

作者：

Choi, Ju Hui ^{[1
]}

Choi, Yoon Hyuck ^{[1
]}

Kang, Dong-Hyung ^{[1
]}

Park, Yeonjoo ^{[1
]}

Song, Jung-Bin ^{[2
]}

Ha, Sun-Kyoung ^{[3
]}

Park, Minwon ^{[3
]}

Lee, Haigun ^{[1
]}

机构：

[1] Korea Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea

[2] MIT, Francis Bitter Magnet Lab, Cambridge, MA 02139 USA

[3] Changwon Natl Univ, Dept Elect Engn, Chang Won 641773, South Korea

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2015年 / 25卷 / 03期

基金：

新加坡国家研究基金会;

关键词：

Critical current; damage; degradation; inhomogeneity; n-value; REBCO coated conductors (CCs); PROGRESS;

D O I：

10.1109/TASC.2014.2365110

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effects of inhomogeneous critical current (I-c) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I-c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I-c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition.

引用

页数：5

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