Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy

被引：87
作者：
Hoelscher, H.
机构：
[1] CeNTech, D-48149 Munster, Germany
[2] Univ Munster, Inst Phys, D-48149 Munster, Germany
来源：
APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 12期
关键词：
D O I：
10.1063/1.2355437
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The author introduces an algorithm for the reconstruction of the tip-sample interactions in amplitude modulation atomic force microscopy ("tapping mode"). The method is based on the recording of amplitude and phase versus distance curves and allows the reconstruction of tip-sample force and energy dissipation as a function of the actual tip-sample distance. The proposed algorithm is verified by a numerical simulation and applied to a silicon sample in ambient conditions. (c) 2006 American Institute of Physics.
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页数：3
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