Cascade Phonon-Assisted Trapping of Positrons by Divacancies in n-FZ-Si(P) Single Crystals Irradiated with 15 MeV Protons

被引:2
作者
Arutyunov, N. Yu. [1 ,2 ]
Emtsev, V. V. [3 ]
Krause-Rehberg, R. [1 ]
Kessler, C. [1 ]
Elsayed, M. [1 ,4 ]
Oganesyan, G. A. [3 ]
Kozlovski, V. V. [5 ]
机构
[1] Martin Luther Univ Halle Wittenberg, Dept Phys, D-06120 Halle, Germany
[2] Inst Ion Plasma & Laser Technol, Inst Elect, Tashkent 700187, Uzbekistan
[3] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[4] Menia Univ, Fac Sci, Phys Dept, Al Minya, Egypt
[5] St Petersburg State Polytech Univ, St Petersburg 195251, Russia
来源
INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013 | 2014年 / 1583卷
关键词
divacancies; radiation defects; silicon; positron; annihilation radiation; N-TYPE SILICON; DEFECTS;
D O I
10.1063/1.4865601
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The trapping of positrons by the radiation defects in moderately doped oxygen-lean n-FZ-Si(P) single crystal irradiated with 15 MeV protons has been investigated in a comparative way using the positron lifetime spectroscopy and Hall effect measurements. The experiments were carried out within a wide temperature interval ranging from 25 K - 29 K to 300 K. The positron trapping rate for divacancies was reconstructed in the course of many-stage isochronal annealing. The concentration and the charged states of divacancies (V-2(-) and V-2(--)) were estimated. The temperature dependency of the trapping cross section of positrons by the negatively charged divacancies is in a good agreement with the data of calculations based on the assumptions of the cascade phonon-assisted mechanism of exchange of the energy between the positron and acoustic long-wave phonons. Obeying similar to T-3 law, the cross-section of the trapping of positrons by divacancies changes considerably ranging from similar to 1.7x10(-12) cm(2) (66 - 100 K) to similar to 2x10(-14) cm(2) (approximate to 250 K). The characteristic length of trapping of the positron by V-2(--) divacancy was estimated to be l(0) (V-2(--)) approximate to (3.4 +/- 0.2) x10(-8) cm.
引用
收藏
页码:41 / 45
页数:5
相关论文
共 14 条
  • [1] ABAKUMOV VN, 1978, SOV PHYS SEMICOND+, V12, P1
  • [2] Positron annihilation on defects in silicon irradiated with 15 MeV protons
    Arutyunov, N. Y.
    Elsayed, M.
    Krause-Rehberg, R.
    Emtsev, V. V.
    Oganesyan, G. A.
    Kozlovski, V. V.
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2013, 25 (03)
  • [3] Positron Probing of Point Radiation Defects in Proton - Irradiated FZ-Silicon Single Crystals
    Arutyunov, N. Yu.
    Elsayed, M.
    Krause-Rehberg, R.
    Emtsev, V. V.
    Oganesyan, G. A.
    Kozlovski, V. V.
    [J]. GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY XIV, 2011, 178-179 : 313 - +
  • [4] POSITRON DYNAMICS IN SOLIDS
    BRANDT, W
    [J]. APPLIED PHYSICS, 1974, 5 (01): : 1 - 23
  • [5] Direct Observation of Electron Capture and Reemission by the Divacancy via Charge Transient Positron Spectroscopy
    Edwardson, C. J.
    Coleman, P. G.
    Paez, D. J.
    Doylend, J. K.
    Knights, A. P.
    [J]. PHYSICAL REVIEW LETTERS, 2013, 110 (13)
  • [6] Emtsev V.V., 2012, [Физика и техника полупроводников, Fizika i tekhnika poluprovodnikov], V46, P473
  • [7] Emtsev V.V., 1981, IMPURITIES POINT DEF, P42
  • [8] Momentum distributions of electron-positron pairs annihilating at vacancy clusters in Si
    Hakala, M
    Puska, MJ
    Nieminen, RM
    [J]. PHYSICAL REVIEW B, 1998, 57 (13): : 7621 - 7627
  • [9] Kimerling L. C., 1979, International Conference on Defects and Radiation Effects in Semiconductors, P273
  • [10] ANNEALING OF ELECTRON-IRRADIATED N-TYPE SILICON .1. DONOR CONCENTRATION DEPENDENCE
    KIMERLING, LC
    DEANGELIS, HM
    CARNES, CP
    [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (02): : 427 - +