Weak developments and metrization

被引:27
|
作者
Alleche, B
Arhangel'skii, AV
Calbrix, J
机构
[1] Univ Rouen, CNRS, UPRESA 6085, F-76821 Mt St Aignan, France
[2] Moscow MV Lomonosov State Univ, Dept Math, Moscow, Russia
[3] Ohio Univ, Dept Math, Athens, OH 45701 USA
关键词
metrization; covering properties; development; weak development; weak k-development; base of countable order; sharp base;
D O I
10.1016/S0166-8641(98)00135-7
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
The notions of a weak k-development and of a weak development, defined in terms of sequences of open covers, were recently introduced by the first and the third authors. The first notion was applied to extend in an interesting way Michael's Theorem on double set-valued selections. The second notion is situated between that of a development and of a base of countable order. To see that a space with a weak development has a base of countable order, we use the classical works of H.H. Wicke and J.M. Worrell. We also introduce and study the new notion of a sharp base, which is strictly weaker than that of a uniform base and strictly stronger than that of a base of countable order and of a weakly uniform base, and which is strongly connected to the notion of a weak development. Several examples are exhibited to prove that the new notions do not coincide with the old ones. In short, our results show that the notions of a weak development and of a sharp base fit very well into already existing system of generalized metrizability properties defined in terms of sequences of open covers or bases. Several open questions are formulated. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:23 / 38
页数:16
相关论文
共 50 条
  • [1] EXPLICIT METRIZATION
    SHORE, SD
    SAWYER, LJ
    PAPERS ON GENERAL TOPOLOGY AND APPLICATIONS, 1993, 704 : 328 - 336
  • [2] METRIZATION OF LINEAR CONNECTIONS
    Vanzurova, Alena
    Zackova, Petra
    APLIMAT 2009: 8TH INTERNATIONAL CONFERENCE, PROCEEDINGS, 2009, : 453 - 464
  • [3] A parallel metrization theorem
    Taras Banakh
    Olena Hryniv
    European Journal of Mathematics, 2020, 6 : 110 - 113
  • [4] A parallel metrization theorem
    Banakh, Taras
    Hryniv, Olena
    EUROPEAN JOURNAL OF MATHEMATICS, 2020, 6 (01) : 110 - 113
  • [5] A new approach to metrization
    Arenas, FG
    Sánchez-Granero, MA
    TOPOLOGY AND ITS APPLICATIONS, 2002, 123 (01) : 15 - 26
  • [6] Metrization of Idempotent Convex Compacta
    Nykyforchyn, Oleh
    Savchyn, Mariia
    JOURNAL OF CONVEX ANALYSIS, 2022, 29 (03) : 717 - 730
  • [7] Topological symmetry and the Theory of Metrization
    Hung, HH
    PAPERS ON GENERAL TOPOLOGY AND APPLICATIONS: ELEVENTH SUMMER CONFERENCE AT THE UNIVERSITY OF SOUTHERN MAINE, 1996, 806 : 207 - 213
  • [8] On the metrization problem of ν-generalized metric spaces
    Nguyen Van Dung
    Vo Thi Le Hang
    REVISTA DE LA REAL ACADEMIA DE CIENCIAS EXACTAS FISICAS Y NATURALES SERIE A-MATEMATICAS, 2018, 112 (04) : 1295 - 1303
  • [9] Metrization and Simulation of Controlled Hybrid Systems
    Burden, Samuel A.
    Gonzalez, Humberto
    Vasudevan, Ramanarayan
    Bajcsy, Ruzena
    Sastry, S. Shankar
    IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 2015, 60 (09) : 2307 - 2320
  • [10] D1 Spaces and Their Metrization
    戴牧民
    刘川
    东北数学, 1995, (02) : 215 - 220