Portable multi-anvil device for in situ angle-dispersive synchrotron diffraction measurements at high pressure and temperature

被引：17

作者：

Le Godec, Yann ^{[1
]}

Hamel, Gerard ^{[1
]}

Solozhenko, Vladimir L. ^{[2
]}

Martinez-Garcia, Domingo ^{[3
,4
]}

Philippe, Julien ^{[1
]}

Hammouda, Tahar ^{[5
]}

Mezouar, Mohamed ^{[6
]}

Crichton, Wilson A. ^{[6
]}

Morard, Guillaume ^{[6
]}

Klotz, Stefan ^{[1
]}

机构：

[1] Univ Paris 06, IMPMC, F-75015 Paris, France

[2] Univ Paris 13, CNRS, LPMTM, F-93430 Villetaneuse, France

[3] DFA, Valencia 46100, Spain

[4] ICMUV, Valencia 46100, Spain

[5] Univ Blaise Pascal, LMV, F-63038 Clermont Ferrand, France

[6] ESRF, F-38000 Grenoble, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2009年 / 16卷

关键词：

high pressure; high temperature; multi-anvil system; angle-dispersive X-ray diffraction; NEUTRON POWDER DIFFRACTION; X-RAY-DIFFRACTION; EQUATION-OF-STATE; MAGNETITE FE3O4; CRYSTAL; RADIATION; APPARATUS; DETECTOR; SYSTEM;

D O I：

10.1107/S0909049509012928

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A recently developed portable multi-anvil device for in situ angle-dispersive synchrotron diffraction studies at pressures up to 25 GPa and temperatures up to 2000 K is described. The system consists of a 450 ton V7 Paris-Edinburgh press combined with a Stony Brook 'T-cup' multi-anvil stage. Technical developments of the various modifications that were made to the initial device in order to adapt the latter to angular-dispersive X-ray diffraction experiments are fully described, followed by a presentation of some results obtained for various systems, which demonstrate the power of this technique and its potential for crystallographic studies. Such a compact large-volume set-up has a total mass of only 100 kg and can be readily used on most synchrotron radiation facilities. In particular, several advantages of this new set-up compared with conventional multi-anvil cells are discussed. Possibilities of extension of the (P, T) accessible domain and adaptation of this device to other in situ measurements are given. (C) 2009 International Union of Crystallography Printed in Singapore - all rights reserved

引用

页码：513 / 523

页数：11

共 41 条

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[Anonymous], REV HIGH PRESSURE SC

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