Pattern classification of impulse faults in transformers by wavelet analysis

被引:29
|
作者
Purkait, P [1 ]
Chakravorti, S
机构
[1] Haldia Inst Technol, Instrumentat Engn Dept, Haldia 721657, Midnapore, India
[2] Jadavpur Univ, Dept Elect Engn, Kolkata 700032, W Bengal, India
关键词
D O I
10.1109/TDEI.2002.1024433
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the tests carried out on a transformer after Assembly is the lightning impulse test, for Assessment of the integrity of its winding insulation. In the case of a fault, it has been well established that the, pattern of the: fault currents contains a typical signature of the nature and,location of. the insulation failure, involved. This paper describes a new approach using the 'wavelet transforms' to. classify the patterns inherent in different fault currents. Whereas conventional frequency-response analysis based techniques fail to identify the time-localization of a particular frequency component in a time-dependent signal, the wavelets are not only localized in frequency, but; also in time. The 'time-frequency localization' feature of wavelet transform is employed for pattern classification of impulse fault currents of transformers. Results for simulated models of 3, 5 and 7 MVA transformers are presented to illustrate the ability of this approach to classify insulation failures.
引用
收藏
页码:555 / 561
页数:7
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