Interferometer control of optical tweezers

被引:3
作者
Decker, AJ [1 ]
机构
[1] NASA, Glenn Res Ctr, Cleveland, OH 44135 USA
来源
INTERFEROMETRY XI: APPLICATIONS | 2002年 / 4778卷
关键词
interferometry; optical tweezers; nanotechnology;
D O I
10.1117/12.473537
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper discusses progress in using spatial light modulators and interferometry to control the beam profile of an optical tweezers. The approach being developed is to use a spatial light modulator (SLM) to control the phase profile of the tweezers beam and to use a combination of the SLM and interferometry to control the intensity profile. The objective is to perform fine and calculable control of the moments and forces on a tip or tool to be used to manipulate and interrogate nanostructures. The performance of the SLM in generating multiple and independently controllable tweezers beams is also reported. Concurrent supporting research projects are mentioned and include tweezers beam scattering and neural-net processing of the interference patterns for control of the tweezers beams.
引用
收藏
页码:142 / 149
页数:8
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