High-pressure high-temperature XAFS investigation on HgTe

X-ray absorption measurements at the L-3 edge of Hg is solid and liquid Hg/Te have been performed under high-temperature and high-pressure up to 1000 K and 3 GPa using a large volume Paris-Edinburgh press. EXAFS spectra have been analyzed with GNXAS approach. The pressure dependencies of the nearest neighbor distance and the bond variance at room temperature as well as their variation with temperature at 0.6 GPa have been obtained, The temperature dependence of the bond variance has been fitted to the Einstein model and is consistent to the decrease or the bulk modulus with increasing temperature, which has recently been shown to occur by an x-ray diffraction study.