Kirkpatrick-Baez mirrors to focus hard X-rays in two dimensions as fabricated, tested and installed at the Advanced Photon Source

被引:11
作者
Kujala, Naresh [1 ]
Marathe, Shashidhara [1 ]
Shu, Deming [1 ]
Shi, Bing [1 ]
Qian, Jun [1 ]
Maxey, Evan [1 ]
Finney, Lydia [1 ]
Macrander, Albert [1 ]
Assoufid, Lahsen [1 ]
机构
[1] Argonne Natl Lab, Lemont, IL 60439 USA
来源
JOURNAL OF SYNCHROTRON RADIATION | 2014年 / 21卷
关键词
hard X-ray micro-focusing optics; fixed elliptical geometry K-B mirrors; optics and detector beamline; SUBMICROMETER-RESOLUTION; REFRACTIVE LENS; OPTICS; MICROSCOPY;
D O I
10.1107/S1600577514006493
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The micro-focusing performance for hard X-rays of a fixed-geometry elliptical Kirkpatrick-Baez (K-B) mirrors assembly fabricated, tested and finally implemented at the micro-probe beamline 8-BM of the Advanced Photon Source is reported. Testing of the K-B mirror system was performed at the optics and detector test beamline 1-BM. K-B mirrors of length 80 mm and 60 mm were fabricated by profile coating with Pt metal to produce focal lengths of 250 mm and 155 mm for 3 mrad incident angle. For the critical angle of Pt, a broad bandwidth of energies up to 20 keV applies. The classical K-B sequential mirror geometry was used, and mirrors were mounted on micro-translation stages. The beam intensity profiles were measured by differentiating the curves of intensity data measured using a wire-scanning method. A beam size of 1.3 mu m (V) and 1.2 mu m (H) was measured with monochromatic X-rays of 18 keV at 1-BM. After installation at 8-BM the measured focus met the design requirements. In this paper the fabrication and metrology of the K-B mirrors are reported, as well as the focusing performances of the full mirrors-plus-mount set-up at both beamlines.
引用
收藏
页码:662 / 668
页数:7
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