A Benchmark of Deep Learning Models for Multi-leaf Diseases for Edge Devices

被引:16
作者
Pham Tuan Anh [1 ]
Hoang Trong Minh Duc [2 ]
机构
[1] Posts & Telecommun Inst Technol, Hanoi, Vietnam
[2] Hanoi Univ Sci & Technol, SET, Hanoi, Vietnam
来源
2021 INTERNATIONAL CONFERENCE ON ADVANCED TECHNOLOGIES FOR COMMUNICATIONS (ATC 2021) | 2021年
关键词
deep learning; edge computing; precision agriculture; multi-leaf disease; image processing;
D O I
10.1109/ATC52653.2021.9598196
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Every season, leaf diseases are one of the main causes affecting the production of many crops, which cause enormous damage to farmers. To minimize the loss, deep learning techniques are utilized to detect leaf infection and have wildly outperformed the traditional method of manual detection. However, deploying such models is a challenge since devices in the field normally have limited resources and low computational power while large datasets have to be used. Therefore, in this paper, we benchmark the most popular deep learning models for multi-leaf disease detection to gauge which model is the most suitable for real deployment. Using a real-world large-scale dataset from PlantVillage and a Raspberry Pi 3, we found that MobileNet V3 provides a reliable accuracy of 96.58%, small Inference/Initialization time of 127 ms and 11 ms respectively, requires only 7.4 MB of memory in total, and hence the most appropriate choice for a real farm.
引用
收藏
页码:318 / 323
页数:6
相关论文
共 26 条
[1]  
[Anonymous], 2016, ARXIV161206052
[2]  
[Anonymous], 2021, TENS LIT 8 BIT QUANT
[3]   Deep Learning With Edge Computing: A Review [J].
Chen, Jiasi ;
Ran, Xukan .
PROCEEDINGS OF THE IEEE, 2019, 107 (08) :1655-1674
[4]  
Deng J, 2009, PROC CVPR IEEE, P248, DOI 10.1109/CVPRW.2009.5206848
[5]  
Ding R., 2019, P 2019 IEEE INT C EL, P1
[6]  
Fan Y., 2021, Applied Intelligence, P1
[7]   A Survey of Methods for Low-Power Deep Learning and Computer Vision [J].
Goel, Abhinav ;
Tung, Caleb ;
Lu, Yung-Hsiang ;
Thiruvathukal, George K. .
2020 IEEE 6TH WORLD FORUM ON INTERNET OF THINGS (WF-IOT), 2020,
[8]  
Han S., 2015, INT C NEURAL INFORM
[9]   Deep Residual Learning for Image Recognition [J].
He, Kaiming ;
Zhang, Xiangyu ;
Ren, Shaoqing ;
Sun, Jian .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :770-778
[10]  
Howard A.G., 2017, ARXIV, V1704, P4861