Research on technology prospect risk of high-tech projects based on patent analysis

被引:10
作者
Zhang, Liwei [1 ]
Liu, Zhihui [2 ]
机构
[1] Capital Univ Econ Business, Sch Management & Engn, Beijing, Peoples R China
[2] Inst Sci & Tech Informat China, Res Ctr Informat Sci Methodol, Beijing, Peoples R China
基金
中国国家自然科学基金;
关键词
RESEARCH-AND-DEVELOPMENT; VISUALIZATION; INDICATORS; INNOVATION; SYSTEM; IDENTIFICATION; CITATIONS; PLATFORM; SCIENCE; NOVELTY;
D O I
10.1371/journal.pone.0240050
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The uncertainty of high technology has determined the high-risk character of high-tech projects. Thus, it is of great importance to effectively avoid the risk of high-tech projects by thoroughly analyzing projects' methodologies and fully understanding the technology prospect risk of projects in the feasibility study phase. This study proposes a systematic research framework to identify and analyze the technology prospect risk of projects based on patent analysis. Thus, text mining technology and principal component analysis are used to improve the traditional patent map method and construct a technology prospect risk map. Moreover, patent value evaluation and correlation analysis methods are combined to identify technology potential areas and calculate the value of technology prospect risk. At the same time, an empirical study is conducted with project cases in the field of optical communications, and the technology prospect risk situations of these projects are ascertained through qualitative and quantitative methods. The study is innovative and practical and offers a better combination of analysis methods for current technology development and specific projects.
引用
收藏
页数:19
相关论文
共 64 条
[1]   A literature review on the state-of-the-art in patent analysis [J].
Abbas, Assad ;
Zhang, Limin ;
Khan, Samee U. .
WORLD PATENT INFORMATION, 2014, 37 :3-13
[2]   Innovation assessment through patent analysis [J].
Abraham, BP ;
Moitra, SD .
TECHNOVATION, 2001, 21 (04) :245-252
[3]   PATENTS AND THE MEASUREMENT OF TECHNOLOGICAL-CHANGE - A SURVEY OF THE LITERATURE [J].
BASBERG, BL .
RESEARCH POLICY, 1987, 16 (2-4) :131-141
[4]   Review of the state-of-the-art in patent information and forthcoming evolutions in intelligent patent informatics [J].
Bonino, Dario ;
Ciaramella, Alberto ;
Corno, Fulvio .
WORLD PATENT INFORMATION, 2010, 32 (01) :30-38
[5]  
Camus C., 2003, World Patent Information, V25, P155, DOI 10.1016/S0172-2190(02)00131-X
[6]   Using patent analyses to monitor the technological trends in an emerging field of technology: a case of carbon nanotube field emission display [J].
Chang, Pao-Long ;
Wu, Chao-Chan ;
Leu, Hoang-Jyh .
SCIENTOMETRICS, 2010, 82 (01) :5-19
[7]   Design patent map visualization display [J].
Chen, Rain .
EXPERT SYSTEMS WITH APPLICATIONS, 2009, 36 (10) :12362-12374
[8]  
Choi C, 2009, TECHNOLOGICAL FORECA, V76, P769
[9]   An SAO-based text mining approach to building a technology tree for technology planning [J].
Choi, Sungchul ;
Park, Hyunseok ;
Kang, Dongwoo ;
Lee, Jae Yeol ;
Kim, Kwangsoo .
EXPERT SYSTEMS WITH APPLICATIONS, 2012, 39 (13) :11443-11455
[10]   Patent indicators for monitoring convergence - examples from NFF and ICT [J].
Curran, Clive-Steven ;
Leker, Jens .
TECHNOLOGICAL FORECASTING AND SOCIAL CHANGE, 2011, 78 (02) :256-273