Ultimate Monolithic-3D Integration With 2D Materials: Rationale, Prospects, and Challenges

被引:98
作者
Jiang, Junkai [1 ]
Parto, Kamyar [1 ]
Cao, Wei [1 ]
Banerjee, Kaustav [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
来源
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2019年 / 7卷 / 01期
基金
日本科学技术振兴机构;
关键词
3D integration; 2D layered materials; h-BN; MoS2; WSe2; beyond-Moore integration; electromagnetic interference; graphene; interconnect; interface thermal conductivity; Moore's law; thermal profile; vertically-stacked devices; TEMPERATURE-DEPENDENT RAMAN; THERMAL-CONDUCTIVITY; HIGH-QUALITY; WAFER-SCALE; INTERCONNECT PERFORMANCE; CARBON NANOMATERIALS; BILAYER GRAPHENE; MONOLAYER MOS2; OPPORTUNITIES; DEPOSITION;
D O I
10.1109/JEDS.2019.2925150
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As a possible pathway to continue Moore's law indefinitely into the future as well as unprecedented beyond-Moore heterogeneous integration, we examine the prospects of building monolithic 3D integrated circuits (M3D-IC) with atomically-thin or 2D van der Waals materials in terms of overcoming the major drawbacks of current 3D-ICs, including low process thermal budget, inter-tier signal delay, chip-overheating, and inter-tier electrical interference problems. Our holistic evaluation includes consideration of the electrical performance, thermal issues, and electromagnetic interference as well as attention to the synthesis methods necessary for low-temperature transfer-free 2D materials growth in M3D fabrication. Both in-plane and out-of-plane heat-dissipation in 3D-ICs made with 2D materials are evaluated and compared with those of bulk materials. Electrostatic and high-frequency electric-field simulations are conducted to assess the screening effect by graphene and effect of scaling down the inter-layer dielectric (ILD) thickness. Our analysis reveals for the first time that the 2D-based M3D integration can offer >ten-folds higher integration density compared with through-silicon-via (TSV)-based 3D integration, and >150% integration density improvement with respect to conventional M3D integration. Therefore, 2D materials provide a significantly better platform, with respect to bulk materials (such as Si, Ge, GaN), for realizing ultra-high-density M3D-ICs of ultimate thinness for next-generation electronics.
引用
收藏
页码:878 / 887
页数:10
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