Surface and electron emission properties of hydrogen-free diamond-like carbon films investigated by atomic force microscopy

被引:14
|
作者
Liu, Dongping
Zhang, Sam
Ong, Soon-Eng
Benstetter, Guenther
Du, Hejun
机构
[1] Dalian Natl Univ, Sch Math & Phys, Dalian 116600, Peoples R China
[2] Univ Appl Sci Deggendorf, Dept Elect Engn, D-94469 Deggendorf, Germany
[3] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2006年 / 426卷 / 1-2期
基金
中国国家自然科学基金;
关键词
electron emission; diamond-like carbon; conducting atomic force microscopy;
D O I
10.1016/j.msea.2006.03.092
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, we have deposited hydrogen-free diamond-like carbon (DLC) films by using DC magnetron sputtering of graphite target at various r.f. bias voltages. Surface and nanoscale emission properties of these DLC films have been investigated using a combination of atomic force microscopy (AFM)-based nanowear tests and conducting-AFM, by simultaneously measuring the topography and the conductivity of the samples. Nanowear tests show that these DLC films are covered with the thin (1.5-2.0 nm) graphite-like layers at surfaces. Compared to the film bulk structure, the graphite-like surface layers are more conductive. The graphite-like surface layers significantly influence the electron emission properties of these films. Low-energy carbon species can be responsible for the formation of graphite-like surface layers. Nanoscale electron emission measurements have revealed the inhomogeneous emission nature of these films. The low-field emission from these films can be attributed to the existence of sp(2)-configured nanoclusters inside the films. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:114 / 120
页数:7
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