Elemental depth imaging of solutions for monitoring corrosion process of steel sheet by confocal micro X-ray fluorescence

被引：11

作者：

Hirano, S. ^{[1
]}

Akioka, K. ^{[2
]}

Doi, T. ^{[2
]}

Arai, M. ^{[2
]}

Tsuji, K. ^{[1
]}

机构：

[1] Osaka City Univ, Grad Sch Engn, Sumiyoshi Ku, Osaka 5588585, Japan

[2] Nippon Steel & Sumitomo Met Corp, Amagasaki, Hyogo 6600891, Japan

来源：

X-RAY SPECTROMETRY | 2014年 / 43卷 / 04期

关键词：

XRF; OPTICS;

D O I：

10.1002/xrs.2542

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Non-destructive and non-contact analysis has been in demand on numerous occasions. Confocal micro X-ray fluorescence analysis enables depth-selective elemental analysis of solid samples in the laboratory. In this paper, we applied this technique for imaging elemental distributions in solutions. A low-carbon steel sheet was placed in artificial seawater (NaCl: 3.5 mass%), and the corrosion process in the solution was observed. A depth image of Fe Ka intensity in the NaCl solution was obtained by using this technique. The Fe Ka intensity in the solution was measured with corrosion time by sequential line analysis at a fixed lateral position. The corrosion of Fe from the steel sheet, the migration of Fe ions in solution, and their condensation near a polymer window were successfully monitored. Copyright (C) 2014 John Wiley & Sons, Ltd.

引用

页码：216 / 220

页数：5

共 17 条

[1] Monolithic polycapillary x-ray optics engineered to meet a wide range of applications [J].

Ding, X ;

Gao, N ;

Havrilla, G .

ADVANCES IN LABORATORY-BASED X-RAY SOURCES AND OPTICS, 2000, 4144 :174-182

[2] In situ scanning tunneling microscopy in electrolyte solutions [J].

Itaya, K .

PROGRESS IN SURFACE SCIENCE, 1998, 58 (03) :121-247

[3] A new 3D micro X-ray fluorescence analysis set-up - First archaeometric applications [J].

Kanngiesser, B ;

Malzer, W ;

Reiche, I .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 211 (02) :259-264

[4]

Kumakhov MA, 2000, X-RAY SPECTROM, V29, P343, DOI 10.1002/1097-4539(200009/10)29:5<343::AID-XRS414>3.0.CO

[5]

2-S

[6] SURFACE-ENHANCED SPECTROSCOPY [J].

MOSKOVITS, M .

REVIEWS OF MODERN PHYSICS, 1985, 57 (03) :783-826

[7] Depth Elemental Imaging of Forensic Samples by Confocal micro-XRF Method [J].

Nakano, Kazuhiko ;

Nishi, Chihiro ;

Otsuki, Kazunori ;

Nishiwaki, Yoshinori ;

Tsuji, Kouichi .

ANALYTICAL CHEMISTRY, 2011, 83 (09) :3477-3483

[8] Development of a high-resolution confocal micro-XRF instrument equipped with a vacuum chamber [J].

Nakazawa, Takashi ;

Tsuji, Kouichi .

X-RAY SPECTROMETRY, 2013, 42 (05) :374-379

[9] Depth-selective elemental imaging of microSD card by confocal micro XRF analysis [J].

Nakazawa, Takashi ;

Tsuji, Kouichi .

X-RAY SPECTROMETRY, 2013, 42 (03) :123-127

[10] In situ x-ray absorption near edge structure study of the potential dependence of the formation of the passive film on iron in borate buffer [J].

Oblonsky, LJ ;

Davenport, AJ ;

Ryan, MP ;

Isaacs, HS ;

Newman, RC .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1997, 144 (07) :2398-2404

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