A Low Power 6-bit Flash ADC With Reference Voltage and Common-Mode Calibration

被引:49
作者
Chen, Chun-Ying [1 ]
Le, Michael Q. [1 ]
Kim, Kwang Young [1 ]
机构
[1] Broadcom Corp, Irvine, CA 92618 USA
关键词
Analog-to-digital (A/D) conversion; calibration; mixed analog-digital integrated circuits; offset cancellation;
D O I
10.1109/JSSC.2009.2014701
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a low power 6-bit ADC that uses reference voltage and common-mode calibration is presented. A method for adjusting the differential and common-mode reference voltages used by the ADC to improve its linearity is described. Power dissipation is reduced by using small device sizes in the ADC and relying on calibration to cancel the large non-ideal offsets due to device mismatches. The ADC occupies 0.13 mm(2) in 65 nm CMOS and dissipates 12 mW at. a sample rate of 800 MS/s from a 1.2 V supply.
引用
收藏
页码:1041 / 1046
页数:6
相关论文
共 20 条
[1]  
BULT K, 1997, ISSCC SAN FRANC CA F, P136
[2]  
Chen CY, 2008, SYMP VLSI CIRCUITS, P12, DOI 10.1109/VLSIC.2008.4585932
[3]  
CHOI M, 2001, IEEE INT SOL STAT CI, P126
[4]   ON THE RELATIONSHIP BETWEEN TOPOGRAPHY AND TRANSISTOR MATCHING IN AN ANALOG CMOS TECHNOLOGY [J].
GREGOR, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (02) :275-282
[5]   A DSP based 10BaseT/100BaseTX ethernet transceiver in a 1.8V, 0.18um CMOS technology [J].
Huss, S ;
Mullen, M ;
Gray, CT ;
Smith, R ;
Summers, M ;
Shafer, J ;
Heron, P ;
Sawinska, T ;
Medero, J .
PROCEEDINGS OF THE IEEE 2001 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2001, :135-138
[6]  
Jiang XC, 2003, ISSCC DIG TECH PAP I, V46, P322
[7]  
Kattmann K., 1991, IEEE INT SOLID STATE, P170
[8]   A 500-MSample/s, 6-bit Nyquist-rate ADC for disk-drive read-channel applications [J].
Mehr, I ;
Dalton, D .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (07) :912-920
[9]   A 21mW 8b 125MS/s ADC occupying 0.09mm2 in 0.13μm CMOS [J].
Mulder, J ;
Ward, CM ;
Lin, CH ;
Kruse, D ;
Westra, JR ;
Lugthart, ML ;
Arslan, E ;
van de Plassche, RJ ;
Bult, K ;
van der Goes, FML .
2004 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE, DIGEST OF TECHNICAL PAPERS, 2004, 47 :260-261
[10]  
NAGARAJ K, 2000, ISSCC, P426