The tunability of highly textured thin films of barium strontium titanate (Ba0.5Sr0.5TiO3, BST) is analyzed theoretically using a Landau-Devonshire thermodynamic model. The relative dielectric constant of BST films is determined as functions of the applied external electric field, deposition temperature, and the thermal expansion coefficient of the substrate. Our analysis shows that tunability is highly dependent upon thermally induced strains within the material. Both tension and compression produce deleterious tuning response. However, this effect can be minimized through judicious choices of deposition temperature and appropriate substrate material. (C) 2004 American Institute of Physics.
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George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USAGeorge Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Chang, WT
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Gilmore, CM
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Gilmore, CM
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Kim, WJ
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Kim, WJ
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Pond, JM
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Pond, JM
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Kirchoefer, SW
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Kirchoefer, SW
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Qadri, SB
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Qadri, SB
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Chirsey, DB
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Chirsey, DB
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Horwitz, JS
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机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
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USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Cole, MW
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Nothwang, WD
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USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Nothwang, WD
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Hubbard, C
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USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Hubbard, C
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Ngo, E
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USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Ngo, E
;
Ervin, M
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USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
机构:
George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USAGeorge Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Chang, WT
;
Gilmore, CM
论文数: 0引用数: 0
h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Gilmore, CM
;
Kim, WJ
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h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Kim, WJ
;
Pond, JM
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h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Pond, JM
;
Kirchoefer, SW
论文数: 0引用数: 0
h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Kirchoefer, SW
;
Qadri, SB
论文数: 0引用数: 0
h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Qadri, SB
;
Chirsey, DB
论文数: 0引用数: 0
h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
Chirsey, DB
;
Horwitz, JS
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h-index: 0
机构:George Washington Univ, Sch Engn & Appl Sci, Inst Sci Mat, Washington, DC 20052 USA
机构:
USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Cole, MW
;
Nothwang, WD
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Nothwang, WD
;
Hubbard, C
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机构:
USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Hubbard, C
;
Ngo, E
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h-index: 0
机构:
USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
Ngo, E
;
Ervin, M
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h-index: 0
机构:
USA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USAUSA, Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA