Self-sensing piezoresistive cantilever and its magnetic force microscopy applications

被引：35

作者：

Takahashi, H ^{[1
]}

Ando, K ^{[1
]}

Shirakawabe, Y ^{[1
]}

机构：

[1] Seiko Instruments Inc, Sci Instruments Div, Chiba 2702222, Japan

来源：

ULTRAMICROSCOPY | 2002年 / 91卷 / 1-4期

关键词：

Si micro-cantilever; piezoresistor; scanning probe microscopy; magnetic force microscopy;

D O I：

10.1016/S0304-3991(02)00083-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A newly developed Si self-sensing piezoresistive cantilever is presented. Si piezoresistive cantilevers for scanning microscopy are fabricated by Si micro-machining technique. The sensitivity of the piezoresistive cantilever is comparable to the current laser detecting system. Topographic images are successfully obtained with the piezoresistive cantilever and some comparisons are made with the laser detecting system. Furthermore, the magnetic film (Co-Cr-Pt) is coated on the tip of the piezoresistive cantilever for magnetic force microscopy (MFM) application. The magnetic images are successfully obtained with the self-sensing MFM piezoresistive cantilever. The self-sensing piezoresistive cantilevers have been successfully applied in scanning probe microscopy and MFM. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：63 / 72

页数：10

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