Effect of electric field and post-treatment on dielectric behavior of SrTiO3 single crystal

被引:35
作者
Ang, C [1 ]
Guo, RY [1 ]
Bhalla, AS [1 ]
Cross, LE [1 ]
机构
[1] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA
关键词
D O I
10.1063/1.372438
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of dc electric field and post-treatment on the dielectric properties of SrTiO3 single crystals are reported. Both the dielectric constant and the loss tan delta decrease after post-treatment in flowing oxygen environment for 26 h at 1100 degrees C. The possible physical mechanism is briefly discussed. The dielectric behavior under dc electric field is measured. The rounded dielectric constant peak is induced by application of dc bias, and the corresponding dielectric loss is presented, which show more complicated behavior and usually are missing in the literature. In this work, it is found that the temperature (T-m) of the dielectric constant maximum shifts to higher temperatures with increasing dc electric field E, and follows the T(m)similar to E-2/3 relation, indicating an induced ferroelectric-like behavior with the second-order phase transition under dc bias. (C) 2000 American Institute of Physics. [S0021-8979(00)03708-7].
引用
收藏
页码:3937 / 3940
页数:4
相关论文
共 24 条
  • [1] Dielectric anomalies in bismuth-doped SrTiO3:: Defect modes at low impurity concentrations
    Ang, C
    Yu, Z
    Hemberger, J
    Lunkenheimer, P
    Loidl, A
    [J]. PHYSICAL REVIEW B, 1999, 59 (10) : 6665 - 6669
  • [2] Dielectric and ultrasonic anomalies at 16, 37, and 65 K in SrTiO3
    Ang, C
    Scott, JF
    Yu, Z
    Ledbetter, H
    Baptista, JL
    [J]. PHYSICAL REVIEW B, 1999, 59 (10): : 6661 - 6664
  • [3] ELECTRIC-FIELD-INDUCED RAMAN SCATTERING IN SRTIO3 AND KTAO3
    FLEURY, PA
    WORLOCK, JM
    [J]. PHYSICAL REVIEW, 1968, 174 (02): : 613 - &
  • [4] INFLUENCE OF HYDROSTATIC-PRESSURE ON FIELD-INDUCED DIELECTRIC-CONSTANT MAXIMA OF SRTIO3
    FRENZEL, C
    HEGENBARTH, E
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 23 (02): : 517 - 521
  • [5] High dielectric constant and tunability of epitaxial SrTiO3 thin film capacitors
    Fuchs, D
    Schneider, CW
    Schneider, R
    Rietschel, H
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 85 (10) : 7362 - 7369
  • [6] CHARACTERIZATION OF A TUNABLE THIN-FILM MICROWAVE YBA2CU3O7-X/SRTIO3 COPLANAR CAPACITOR
    GALT, D
    PRICE, JC
    BEALL, JA
    ONO, RH
    [J]. APPLIED PHYSICS LETTERS, 1993, 63 (22) : 3078 - 3080
  • [7] FERROELECTRIC THIN-FILM CHARACTERIZATION USING SUPERCONDUCTING MICROSTRIP RESONATORS
    GALT, D
    PRICE, JC
    BEALL, JA
    HARVEY, TE
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1995, 5 (02) : 2575 - 2578
  • [8] ELECTRIC-FIELD-DEPENDENT DIELECTRIC-CONSTANT AND NONLINEAR SUSCEPTIBILITY IN SRTIO3
    HEMBERGER, J
    LUNKENHEIMER, P
    VIANA, R
    BOHMER, R
    LOIDL, A
    [J]. PHYSICAL REVIEW B, 1995, 52 (18): : 13159 - 13162
  • [9] Nonlinear behavior of thin film SrTiO3 capacitors at microwave frequencies
    Kozyrev, AB
    Samoilova, TB
    Golovkov, AA
    Hollmann, EK
    Kalinikos, DA
    Loginov, VE
    Prudan, AM
    Soldatenkov, OI
    Galt, D
    Mueller, CH
    Rivkin, TV
    Koepf, GA
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 84 (06) : 3326 - 3332
  • [10] Thickness dependence of dielectric loss in SrTiO3 thin films
    Li, HC
    Si, WD
    West, AD
    Xi, XX
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (04) : 464 - 466