Friction traced to the single atom

被引：85

作者：

Giessibl, FJ ^{[1
]}

Herz, M ^{[1
]}

Mannhart, J ^{[1
]}

机构：

[1] Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany

来源：

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA | 2002年 / 99卷 / 19期

关键词：

D O I：

10.1073/pnas.182160599

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Friction is caused by dissipative lateral forces that act between macroscopic objects. An improved understanding of friction is therefore expected from measurements of dissipative lateral forces acting between individual atoms. Here we establish atomic resolution of both conservative and dissipative forces by lateral force microscopy, presenting the resolution of atomic defects. The interaction between a single-tip atom that is oscillated parallel to an Si(111)-(7 x 7) surface is measured. A dissipation energy of up to 4 eV per oscillation cycle is found. The dissipation is explained by a "plucking action of one atom on to the other" as described by G. A. Tomlinson in 1929.

引用

页码：12006 / 12010

页数：5

共 24 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].