Vacancies as compensating centers in bulk GaN: doping effects

被引:24
作者
Saarinen, K
Ranki, V
Suski, T
Bockowski, M
Grzegory, I
机构
[1] Aalto Univ, Phys Lab, FIN-02015 Espoo, Finland
[2] Polish Acad Sci, UNIPRESS, High Pressure Res Ctr, PL-01142 Warsaw, Poland
关键词
Al; defects; doping; Al. positron annihilation; Bl. gallium nitride;
D O I
10.1016/S0022-0248(02)01752-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Gallium vacancy complexes have been identified in n-type bulk GaN by applying positron annihilation spectroscopy. Their formation is suppressed when the material becomes resistive by Mg doping, as expected from the behavior of the V-Ga formation energy as a function of the Fermi level. In Be-doped GaN vacancies are observed even in resistive material. The positron lifetimes show that their open volume is larger than expected for the N vacancy. A possible identification is a V-N - Be-Ga complex, where the atoms neighboring the N vacancy are strongly relaxed outwards, thus increasing the open volume. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:281 / 286
页数:6
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