Rectification of near-field images

被引：2

作者：

Gaikovich, KP ^{[1
]}

Dryakhlushin, VF ^{[1
]}

Nozdrin, YN ^{[1
]}

Reznik, AN ^{[1
]}

Vaks, VL ^{[1
]}

Zhilin, AV ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Phys Microstruct, Nizhnii Novgorod 603950, Russia

来源：

ICTON 2002: PROCEEDINGS OF THE 2002 4TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS AND EUROPEAN SYMPOSIUM ON PHOTONIC CRYSTALS, VOL 1 | 2002年

关键词：

scanning near-field optical microscopy; microwaves; deconvolution;

D O I：

10.1109/ICTON.2002.1009543

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Significant enhancement of resolution in the scanning near-field optical microscopy (SNOM) and in the microwave subsurface imaging is achieved by deconvolution of measured 2-D distributions using Tikhonov's method. This method makes it possible to obtain much better sharpness of images.

引用

页码：192 / 195

页数：4

共 4 条

[1]

DRYAKHLUSHIN VF, 1998, INSTRUMENTS EXPT TEC, V41, P139

[2] Reconstruction of two-dimensional distribution of radio brightness using measurements by an antenna with the known angular pattern [J].

Gaikovich K.P. ;

Zhilin A.V. .

Radiophysics and Quantum Electronics, 1999, 42 (10) :825-833

[3] Optical switch of polarization based on high-TC films [J].

Gaikovich, KP ;

Nozdrin, JN ;

Zhilin, AV .

ICTON 2000: 2ND INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, CONFERENCE PROCEEDINGS, 2000, :173-175

[4]

Tikhonov A. N., 1977, Methods of Solution of Ill-Posed Problems

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