Temperature dependence of solvation forces as measured in atomic force microscopy

被引:22
作者
Lim, L. T. W. [1 ]
Wee, A. T. S. [1 ]
O'Shea, S. J. [2 ]
机构
[1] Natl Univ Singapore, Dept Phys, Singapore 119620, Singapore
[2] Inst Mat Res & Engn, Singapore 117602, Singapore
关键词
atomic force microscopy; graphite; interface phenomena; liquid theory; organic compounds; solvation; surface chemistry; CURVED SOLID-SURFACES; LONG-RANGE ELASTICITY; LAYERING TRANSITION; LUBRICATION FILMS; ADHESION; GRAPHITE; LIQUID; INTERFACES; PARTICLES; BARRIERS;
D O I
10.1063/1.3096967
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An atomic force microscope (AFM) has been used to study the effect of temperature on solvation forces in the liquids octamethylcyclotetrasiloxane, n-hexadecane, and n-dodecanol confined between the AFM tip and a graphite surface. Discrete solvation layers can be observed for all three liquids at all the temperatures measured (298-348K). However, with increasing temperature there is a significant decrease in the magnitude of the measured solvation forces and a reduction in the number of solvation oscillations which can be observed. Solvation forces per se are only weakly temperature dependent and the most plausible explanation is that we are measuring how the layers are squeezed from the tip-sample gap. The squeeze out process is a thermally activated phenomenon and gives rise to the large change in the magnitude of the force oscillations with temperature. A simple analysis is provided based on transition rate theory. The large change in solvation force with temperature has implications for the measurement of localized forces using AFM, particularly in interpreting biological interactions and single asperity friction.
引用
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页数:11
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