The pulsed laser ablation deposition technique: a new deposition configuration for the synthesis of uniform films

被引:18
作者
Guido, D
Cultrera, L
Perrone, A [1 ]
机构
[1] Univ Lecce, Ist Natl Fis Mat, I-73100 Lecce, Italy
[2] Univ Lecce, INFM, Natl Nanotechnol Lab, I-73100 Lecce, Italy
[3] Univ Lecce, Dept Phys, I-73100 Lecce, Italy
[4] Univ Lecce, Natl Nanotechnol Lab, INFM, I-73100 Lecce, Italy
关键词
pulsed laser ablation deposition; plume deflection effect; deposition rate; thickness profile;
D O I
10.1016/j.surfcoat.2003.10.102
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The conventional configuration (substrate parallel and frontal to the target surface) of the pulsed laser ablation deposition technique has been modified for improving the film uniformity with acceptable deposition rates, leading to the 'dynamic deposition configuration'. The novelty of this arrangement is the ability to place by computer-control the substrate synchronously in front of the plume axis compensating the plume deflection effect. The new geometrical configuration was used to deposit films of Ti, Al and Cu. All the deposited films exhibited both high thickness uniformity and remarkable deposition rates. Initial results of the experiments are explained and compared with the results obtained in the conventional configuration, in otherwise similar experimental conditions. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:603 / 606
页数:4
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