共 20 条
Effect of Copper and Nickel Doping on the Optical and Structural Properties of ZnO
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作者:

Muglu, G. Merhan
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机构:
Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey

Saritas, S.
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机构:
Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey

Cakici, T.
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机构:
Ataturk Univ, Ispir Hamza Poat Vocat Sch Higher Educ, Dept Elect & Energy, TR-25250 Erzurum, Turkey Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey

Sakar, B.
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机构:
Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey

Yildirim, M.
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机构:
Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey
机构:
[1] Ataturk Univ, Dept Phys, TR-25250 Erzurum, Turkey
[2] Ataturk Univ, Ispir Hamza Poat Vocat Sch Higher Educ, Dept Elect & Energy, TR-25250 Erzurum, Turkey
来源:
PROCEEDINGS OF THE TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32)
|
2017年
/
1815卷
关键词:
MAGNETIC-PROPERTIES;
SPRAY-PYROLYSIS;
NANOPARTICLES;
CO;
D O I:
10.1063/1.4976386
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
The present study is focused on the Cu doped 7,110 and Ni doped 7110 dilute magnetic semiconductor thin films. ZnO:Cu and ZnO:Ni thin films were grown by Chemically Spray Pyrolysis (CSP) method on glass substrates. Optical analysis of the films was clone spectral absorption and transmittance measurements by UV-Vis double beam spectrophotometer technique. The structure, morphology, topology and elemental analysis of ZnO:Cu and ZnO:Ni dilute magnetic thin films were investigated by X-ray diffraction (XRD), Raman Analysis, field emission scanning electron microscopy (FE-SEM), energy-dispersive X-ray spectroscopy (EDX), atomic force microscopy (AFM) techniques, respectively. Also The magnetic properties of the ZnO:Ni thin film was investigated by vibrating sample magnetometer (VSM) method. VSM measurements of ZnO:Ni thin film showed that the ferromagnetic behavior.
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