A phase demodulation method for two-dimensional grating-based X-ray interferometry

被引:1
作者
Nagai, Kentaro [1 ]
机构
[1] Canon Inc, Corp R&D Headquarters, Frontier Res Ctr, Tokyo 1468501, Japan
来源
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 2014年 / 372卷 / 2010期
关键词
X-ray; phase imaging; Talbot-Lau interferometry; phase demodulation; Fourier transform; phase stepping; CONTRAST;
D O I
10.1098/rsta.2013.0034
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
This paper presents a novel approach to achieving high spatial resolution in the demodulation of images produced by a two-dimensional X-ray Talbot interferometry (XTI) system. Currently, demodulation of XTI images is mainly performed by either phase-stepping (PS) or Fourier transform (FT) methods. However, the PS method for two-dimensional XTI demodulation requires a larger number of exposures and a more complex grating control process than that of one-dimensional XTI. On the other hand, although the FT method uses only a single-fringe image, it gives lower spatial resolution than the PS method. For practical application of two-dimensional XTI, a simpler exposure process with high spatial resolution is required. In this paper, we introduce a hybrid method combining the PS and FT methods. This method simplifies the exposure process in comparison with the PS method required in two-dimensional XTI while achieving higher spatial resolution than the FT method in the demodulation of images. The method works by using additional exposures to eliminate unnecessary spectral components that appear in the FT method. Furthermore, the proposed method is demonstrated by using actual two-dimensional XTI data and shown to achieve high spatial resolution in the demodulation of images for both the x-and y-differential phase components.
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页数:10
相关论文
共 14 条
[1]   Two-dimensional grating-based X-ray phase-contrast imaging using Fourier transform phase retrieval [J].
Itoh, Hidenosuke ;
Nagai, Kentaro ;
Sato, Genta ;
Yamaguchi, Kimiaki ;
Nakamura, Takashi ;
Kondoh, Takeshi ;
Ouchi, Chidane ;
Teshima, Takayuki ;
Setomoto, Yutaka ;
Den, Toru .
OPTICS EXPRESS, 2011, 19 (04) :3339-3346
[2]   Directional x-ray dark-field imaging of strongly ordered systems [J].
Jensen, Torben Haugaard ;
Bech, Martin ;
Zanette, Irene ;
Weitkamp, Timm ;
David, Christian ;
Deyhle, Hans ;
Rutishauser, Simon ;
Reznikova, Elena ;
Mohr, Juergen ;
Feidenhans'l, Robert ;
Pfeiffer, Franz .
PHYSICAL REVIEW B, 2010, 82 (21)
[3]   A two-directional approach for grating based differential phase contrast imaging using hard x-rays [J].
Kottler, C. ;
David, C. ;
Pfeiffer, F. ;
Bunk, O. .
OPTICS EXPRESS, 2007, 15 (03) :1175-1181
[4]   Demonstration of X-Ray Talbot interferometry [J].
Momose, A ;
Kawamoto, S ;
Koyama, I ;
Hamaishi, Y ;
Takai, K ;
Suzuki, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2003, 42 (7B) :L866-L868
[5]   Four-dimensional X-ray phase tomography with Talbot interferometry and white synchrotron radiation: dynamic observation of a living worm [J].
Momose, Atsushi ;
Yashiro, Wataru ;
Harasse, Sebastien ;
Kuwabara, Hiroaki .
OPTICS EXPRESS, 2011, 19 (09) :8423-8432
[6]   A non-free-space propagation x-ray phase contrast imaging method sensitive to phase effects in two directions simultaneously [J].
Olivo, A. ;
Bohndiek, S. E. ;
Griffiths, J. A. ;
Konstantinidis, A. ;
Speller, R. D. .
APPLIED PHYSICS LETTERS, 2009, 94 (04)
[7]   Shearing interferometer for quantifying the coherence of hard x-ray beams [J].
Pfeiffer, F ;
Bunk, O ;
Schulze-Briese, C ;
Diaz, A ;
Weitkamp, T ;
David, C ;
van der Veen, JF ;
Vartanyants, I ;
Robinson, IK .
PHYSICAL REVIEW LETTERS, 2005, 94 (16)
[8]   Two-dimensional gratings-based phase-contrast imaging using a conventional x-ray tube [J].
Sato, Genta ;
Kondoh, Takeshi ;
Itoh, Hidenosuke ;
Handa, Soichiro ;
Yamaguchi, Kimiaki ;
Nakamura, Takashi ;
Nagai, Kentaro ;
Ouchi, Chidane ;
Teshima, Takayuki ;
Setomoto, Yutaka ;
Den, Toru .
OPTICS LETTERS, 2011, 36 (18) :3551-3553
[9]   Selective imaging of nano-particle contrast agents by a single-shot x-ray diffraction technique [J].
Stein, Ashley F. ;
Ilavsky, Jan ;
Kopace, Rael ;
Bennett, Eric E. ;
Wen, Han .
OPTICS EXPRESS, 2010, 18 (12) :13271-13278
[10]   FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY [J].
TAKEDA, M ;
INA, H ;
KOBAYASHI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) :156-160