The X-ray emission of cerium oxide

被引：12
|
作者：
Tobin, J. G. [1 ]
Yu, S. W. [2 ]
Sokaras, D. [3 ]
机构：
[1] Univ Wisconsin, Oshkosh, WI 54901 USA
[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[3] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2021年 / 246卷
关键词：
X-ray emission; Rare earths; Oxides; RARE-EARTH-METALS; DENSITY-OF-STATES; SPECTROSCOPY; 4F; CE; PHOTOEMISSION; SPECTRA; SYSTEMS;
D O I：
10.1016/j.elspec.2020.147007
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Using a combination of spectral simulation with FEFF and experimental data for metallic Ce, it has been possible to extract the Cerium Oxide-only M-4,M-5 X-ray Emission Spectrum (XES) from an experimental result, which had been produced utilizing a combined CeOxide/Ce sample. It is shown that the XES emission for CeOxide-only is significantly different for the M-4 and M-5 edges, with the M-4 XES consistent with normal XES and the M-5 XES exhibiting a continued enhancement associated with a threshold effect, connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).
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页数：8
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