Damage studies on tungsten due to helium ion irradiation

被引：52

作者：

Dutta, N. J. ^{[1
]}

Buzarbaruah, N. ^{[1
]}

Mohanty, S. R. ^{[1
]}

机构：

[1] Inst Plasma Phys, Ctr Plasma Phys, Sonapur 782402, Kamrup, India

来源：

JOURNAL OF NUCLEAR MATERIALS | 2014年 / 452卷 / 1-3期

关键词：

PLASMA-FOCUS DEVICE; PULSED ION; DEPOSITION; BEAM; IMPLANTATION; EVOLUTION; FILMS; GAS;

D O I：

10.1016/j.jnucmat.2014.04.032

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Energetic and high fluence helium ions emitted in a plasma focus device have been used successfully to study the radiation induced damage on tungsten. The reference and irradiated samples were characterized by optical microscopy, field emission scanning electron microscopy, X-ray diffraction and by hardness testers. The micrographs of the irradiated samples at lower magnification show uniform mesh of cracks of micrometer width. However at higher magnification, various types of crystalline defects such as voids, pinholes, bubbles, blisters and microcracks are distinctly noticed. The prominent peaks in X-ray diffraction spectrum of irradiated samples are seen shifted toward higher Bragg angles, thus indicating accumulation of compressive stress due to the heat load delivered by helium ions. A marginal reduction in hardness of the irradiated sample is also noticed. (C) 2014 Elsevier B. V. All rights reserved.

引用

页码：51 / 56

页数：6

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