An Analysis of Conductor Surface Roughness Effects on Signal Propagation for Stripline Interconnects

被引:24
作者
Guo, Xichen [1 ]
Jackson, David R. [1 ]
Koledintseva, Marina Y. [2 ]
Hinaga, Scott [3 ]
Drewniak, James L. [2 ]
Chen, Ji [1 ]
机构
[1] Univ Houston, Dept Elect & Comp Engn, Houston, TX 77204 USA
[2] Missouri Univ Sci & Technol Missouri S&T, Dept Elect & Comp Engn, EMC Lab, Rolla, MO 65401 USA
[3] Cisco Syst Inc, San Jose, CA 95134 USA
关键词
Floquet waves; full-wave; periodic structure; roughness measurement; surface roughness; COPPER FOIL; INTERFACE;
D O I
10.1109/TEMC.2013.2294958
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Conductors with a roughened surface have significant effects on high-speed signal propagation on backplane traces designed for a 10+ Gb/s network. An accurate approach to evaluate these effects, including the signal attenuation and the phase delay, is proposed in this paper. A differential extrapolation roughness measurement technique is first used to extract the dielectric properties of the substrate used for lamination, and then a periodic model is used to calculate an equivalent roughened conductor surface impedance, which is then used to modify the transmission line per-unit-length parameters R and L. The results indicate that the conductor surface roughness increases the conductor loss significantly as well as noticeably increasing the effective dielectric constant. This approach is validated using both a full-wave simulation tool and measurements, and is shown to be able to provide robust results for the attenuation constant within +/- 0.2 Np/m up to 20 GHz.
引用
收藏
页码:707 / 714
页数:8
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