Adsorption at liquid interfaces: A comparison of multiple experimental techniques

被引：1

作者：

Law, B. M. ^{[1
]}

Brown, M. D. ^{[1
]}

Marchand, L. ^{[2
]}

Lurio, L. B. ^{[2
]}

Hamilton, W. A. ^{[3
]}

Kuzmenko, I. ^{[4
]}

Gog, T. ^{[4
]}

Satija, S. ^{[5
]}

Watkins, E. ^{[6
]}

Majewski, J. ^{[6
]}

机构：

[1] Kansas State Univ, Dept Phys, Manhattan, KS 66506 USA

[2] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA

[3] ANSTO, Bragg Inst, Lucas Heights, NSW 2234, Australia

[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[5] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

[6] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

来源：

EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS | 2009年 / 167卷

基金：

美国国家科学基金会;

关键词：

PROFILE;

D O I：

10.1140/epjst/e2009-00947-2

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

It has proven to be a challenging task to quantitatively resolve the interfacial pro. le at diffuse interfaces, such as, the adsorption pro. le near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption pro. le that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry.

引用

页码：127 / 132

页数：6

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