Recent studies have shown that the T-2 control chart with variable sampling intervals (VSI) and/or variable sample sizes (VSS) detects process shifts faster than the traditional T-2 chart. This article extends these studies for processes that are monitored with VSI and VSS using double warning lines (T-2 - DWL). it is assumed that the length of time the process remains in control has exponential distribution. The properties of T-2 - DWL chart are obtained using Markov chains. The results show that the T-2 - DWL chart is quicker than VSI and/or VSS charts in detecting almost all shifts in the process mean.
机构:
Korea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South Korea
Bai, DS
Lee, KT
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机构:
Korea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South Korea
机构:
Korea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South Korea
Bai, DS
Lee, KT
论文数: 0引用数: 0
h-index: 0
机构:
Korea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind Engn, Yusung Gu, Taejon 305701, South Korea