Point defect engineering in thin-film solar cells

被引:323
作者
Park, Ji-Sang [1 ,2 ]
Kim, Sunghyun [1 ,2 ]
Xie, Zijuan [1 ,2 ,3 ]
Walsh, Aron [1 ,2 ,4 ]
机构
[1] Imperial Coll London, Thomas Young Ctr, London, England
[2] Imperial Coll London, Dept Mat, London, England
[3] Harbin Inst Technol, Dept Phys, Harbin, Heilongjiang, Peoples R China
[4] Yonsei Univ, Dept Mat Sci & Engn, Seoul, South Korea
来源
NATURE REVIEWS MATERIALS | 2018年 / 3卷 / 07期
基金
欧盟地平线“2020”;
关键词
OPEN-CIRCUIT VOLTAGE; ELECTRONIC-STRUCTURE; CRYSTALLINE SILICON; CDCL2; TREATMENT; DX CENTERS; PERSISTENT PHOTOCONDUCTIVITY; TOLERANT SEMICONDUCTORS; INDUCED DEGRADATION; HALIDE PEROVSKITES; CADMIUM TELLURIDE;
D O I
10.1038/s41578-018-0026-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Control of defect processes in photovoltaic materials is essential for realizing high-efficiency solar cells and related optoelectronic devices. Native defects and extrinsic dopants tune the Fermi level and enable semiconducting p-n junctions; however, fundamental limits to doping exist in many compounds. Optical transitions from defect states can enhance photocurrent generation through sub-bandgap absorption; however, these defect states are also often responsible for carrier trapping and non-radiative recombination events that limit the voltage in operating solar cells. Many classes of materials, including metal oxides, chalcogenides and halides, are being examined for next-generation solar energy applications, and each technology faces distinct challenges that could benefit from point defect engineering. Here, we review the evolution in the understanding of point defect behaviour from Si-based photovoltaics to thin-film CdTe and Cu(In,Ga)Se-2 technologies, through to the latest generation of halide perovskite (CH3NH3PbI3) and kesterite (Cu2ZnSnS4) devices. We focus on the chemical bonding that underpins the defect chemistry and the atomistic processes associated with the photophysics of charge-carrier generation, trapping and recombination in solar cells. Finally, we outline general principles to enable defect control in complex semiconducting materials.
引用
收藏
页码:194 / 210
页数:17
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