Microstructure and growth mechanism of Pt-Al2O3 co-sputtered nanocermet films studied by SAXS, TEM and AFM

被引:18
作者
Sella, C
Maaza, M
Pardo, B
Dunsteter, F
Martin, JC
SainteCatherine, MC
机构
[1] UNIV MAINE,LAB PHYS ETAT CONDENSE,F-72017 LE MANS,FRANCE
[2] CTR UNIV ORSAY,INST OPT THEOR & APPL,F-91403 ORSAY,FRANCE
[3] ECOLE POLYTECH,SOLIDES IRRADIES LAB,F-91128 PALAISEAU,FRANCE
[4] LAB GENIE ELECT PARIS,F-91191 GIF SUR YVETTE,FRANCE
[5] ETAB TECH CENT ARMEMENT,CREA,DGA,F-94114 ARCUEIL,FRANCE
来源
PHYSICA A | 1997年 / 241卷 / 1-2期
关键词
cermet films; microstructure; growth; low-angle X-ray scattering; transmission electron microscopy; atomic force microscopy;
D O I
10.1016/S0378-4371(97)00082-4
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The physical properties of nanocermets are related mostly to their morphology. In this contribution, we present the microstructural and morphological evolution of co-sputtered Pt-Al2O3 granular films with thickness, metal concentration and thermal annealing. These investigations are achieved by grazing angle X-ray reflectometry, transmission electron microscopy and atomic force microscopy. The experimental results show that (i) the diameter of platinum clusters increases as a function of film thickness, annealing temperature and metal concentration and (ii) a columnar growth is observed whose morphology also depends on the previous parameters and on the growth direction.
引用
收藏
页码:192 / 198
页数:7
相关论文
共 3 条
[1]   AUTOMATIC CHARACTERIZATION OF LAYERS STACKS FROM REFLECTIVITY MEASUREMENTS - APPLICATION TO THE STUDY OF THE VALIDITY-CONDITIONS OF THE GRAZING X-RAYS REFLECTOMETRY [J].
BRIDOU, F ;
PARDO, BA .
JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1990, 21 (04) :183-191
[2]  
DORMANN JL, 1983, J MAGN MAGN MATER, P117
[3]   ADJUSTABLE OPTICAL-PROPERTIES OF COATINGS BASED ON CERMET THIN-FILMS NEAR THE PERCOLATION-THRESHOLD [J].
SELLA, C ;
BICHRI, A ;
MARTIN, JC ;
LAFAIT, J ;
DRISSKHODJA, K ;
BERTHIER, S .
PHYSICA A, 1989, 157 (01) :555-560