Design of an Advanced Programmable Current-Source Gate Driver for Dynamic Control of SiC Device

被引:0
作者
Wang, Xiang [1 ]
Wu, Haimeng [1 ]
Pickert, Volker [1 ]
机构
[1] Newcastle Univ, Sch Engn, Newcastle Upon Tyne, Tyne & Wear, England
来源
THIRTY-FOURTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2019) | 2019年
关键词
active gate driver; SiC Device; current-source; dynamic control; OVERSHOOT; VOLTAGE;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Silicon carbide (SiC) power devices outperform Silicon-based devices in operational voltage levels, power densities, operational temperatures and switching frequencies. However, the gate oxide of SiC-based device is more fragile compared with its Si counterpart. The vulnerability of the gate oxide in SiC power devices requires the development of a gate driver that is able to have more control during the turn-on and turn-off process. This paper proposes an innovative current-source gate driver where the gate current can be fully programmed. The novelty of the gate driver is that the dynamic switching transients and the static on/off-state can be controlled independently. In order to achieve this approach, a signal decomposition and reconstruction technique is proposed to apply the separate control over the dynamic switching transient and the static on/off-state gate voltage respectively. The fundamental principle of the proposed circuit is verified in simulation. In addition, a prototype of the active gate driver has been built and tested to validate the effectiveness of the flexible control over the gate voltage.
引用
收藏
页码:1370 / 1374
页数:5
相关论文
共 20 条
[1]   Review on SiC-MOSFET Devices and Associated Gate Drivers [J].
Alves, Luciano F. S. ;
Lefranc, Pierre ;
Jeannin, Pierre-Olivier ;
Sarrazin, Benoit .
2018 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT), 2018, :824-829
[2]   High-Speed Resonant Gate Driver With Controlled Peak Gate Voltage for Silicon Carbide MOSFETs [J].
Anthony, Philip ;
McNeill, Neville ;
Holliday, Derrick .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2014, 50 (01) :573-583
[3]  
Batzel T. D., 2016, 5 IAJC ISAM INT C
[4]   SiC power MOSFETs performance, robustness and technology maturity [J].
Castellazzi, A. ;
Fayyaz, A. ;
Romano, G. ;
Yang, L. ;
Riccio, M. ;
Irace, A. .
MICROELECTRONICS RELIABILITY, 2016, 58 :164-176
[5]   Isolated Half-Bridge Gate Driver with Integrated High-Side Supply [J].
Chen, Baoxing .
2008 IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-10, 2008, :3615-3618
[6]   A 6.7-GHz Active Gate Driver for GaN FETs to Combat Overshoot, Ringing, and EMI [J].
Dymond, Harry C. P. ;
Wang, Jianjing ;
Liu, Dawei ;
Dalton, Jeremy J. O. ;
McNeill, Neville ;
Pamunuwa, Dinesh ;
Hollis, Simon J. ;
Stark, Bernard H. .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2018, 33 (01) :581-594
[7]   Electrical characterization of trapping phenomena at SiO2/SiC and SiO2/GaN in MOS-based devices [J].
Fiorenza, Patrick ;
Greco, Giuseppe ;
Vivona, Marilena ;
Giannazzo, Filippo ;
Di Franco, Salvatore ;
Frazzetto, Alessia ;
Guarnera, Alfio ;
Saggio, Mario ;
Iucolano, Ferdinando ;
Patti, Alfonso ;
Roccaforte, Fabrizio .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2017, 214 (04)
[8]   Effects of interface states and near interface traps on the threshold voltage stability of GaN and SiC transistors employing SiO2 as gate dielectric [J].
Fiorenza, Patrick ;
Greco, Giuseppe ;
Giannazzo, Filippo ;
Iucolano, Ferdinando ;
Roccaforte, Fabrizio .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2017, 35 (01)
[9]   Active gate voltage control of turn-on di/dt and turn-off dv/dt in insulated gate transistors [J].
Idir, Nadir ;
Bausiere, Robert ;
Franchaud, Jean Jacques .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2006, 21 (04) :849-855
[10]   Improving SiC JFET Switching Behavior Under Influence of Circuit Parasitics [J].
Josifovic, Ivan ;
Popovic-Gerber, Jelena ;
Ferreira, Jan Abraham .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (08) :3843-3854