Miniaturization and Quality-Factor in Substrate Integrated Waveguide Cavities

被引：0
|
作者：
Delmonte, NicolO [1 ]
Bozzi, Maurizio [1 ]
Perregrini, Luca [1 ]
Tomassoni, Cristiano [2 ]
机构：
[1] Univ Pavia, Dept Elect Comp & Biomed Engn, Via Ferrata 1, I-27100 Pavia, Italy
[2] Univ Perugia, Dept Engn, Via G Duranti 93, I-06125 Perugia, Italy
来源：
2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO) | 2018年
关键词：
Cavity resonators; half mode SIW; quality factor; resonator filters; substrate integrated waveguide (SIW); COMPONENTS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the study of the quality-factors of cavity resonators based on the substrate integrated waveguide (SIW) technology. Compact resonator topologies can be obtained by removing part of the metallic structure of the cavities. The study shows a detailed comparison between the performance of various compact resonator topologies at the frequencies of 4 GHz and 10 GHz, using two different substrates of varying thickness. Then, a technique to improve the performance of the compact resonators is presented. The results of the study are then validated by measuring some physical prototypes.
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页数：4
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