FT-UNSHADES-uP: A platform for the analysis and optimal hardening of embedded systems in radiation environments.

被引：16

作者：

Guzman-Miranda, H. ^{[1
]}

Tombs, J. N. ^{[1
]}

Aguirre, M. A. ^{[1
]}

机构：

[1] Univ Seville, Escuela Super Ingenieros, Seville, Spain

来源：

2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5 | 2008年

关键词：

D O I：

10.1109/ISIE.2008.4677166

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Designing dependable systems is a systematic task where area, power and performance are competing constraints. In many applications, design restrictions do no permit the total hardening of a design, leaving some internal circuitry vulnerable to radiation effects. Hierarchical analysis is necessary to identify the relative importance and vulnerability of individual sub-circuits in a design so that selective hardening can be optimally applied. This paper describes the tool FT-UNSHADES-uP which provides an environment and methodology for the rapid dynamic hierarchical analysis of embedded based processor systems using runtime fault injection. A case study is presented analyzing the effects of fault injection in the embedded RAM and internal registers of a MicroBlaze uP system. The results can be used for the optimal hardening of the FPCA or ASIC design.

引用

页码：1682 / 1687

页数：6