Modeling switched-current functional block circuits using VHDL-AMS language

被引：0

作者：

Shi, JL ^{[1
]}

Zeng, X ^{[1
]}

机构：

[1] Fudan Univ, ASIC, Shanghai 200433, Peoples R China

来源：

2001 4TH INTERNATIONAL CONFERENCE ON ASIC PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/ICASIC.2001.982498

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper proposes the behavioral models of the second-generation switched-current functional block circuits using VHDL-AMS language. The proposed models can not only characterize the ideal behavior of the SI circuits, but also capture the SI higher order :aon-ideal effects, which include the charge injection effects and device mismatch effects. The accuracy of the proposed models is verified by the VHDL-AMS simulator ZENI1.0. The experimental results have shown that compared with SPICE, the behavioral modeling error is less than 1.8%, while time-domain behavioral simulation speed up is 1 to 2 orders.

引用

页码：58 / 61

页数：4