Ultra-sensitive direct detection of silver ions via Kelvin probe force microscopy

被引:33
作者
Park, Jinsung [1 ]
Lee, Sangmyung [2 ]
Jang, Kuewhan [2 ]
Na, Sungsoo [2 ]
机构
[1] Korea Univ, Dept Control & Instrumentat Engn, Jochiwon 339700, South Korea
[2] Korea Univ, Dept Mech Engn, Seoul 136701, South Korea
基金
新加坡国家研究基金会;
关键词
Silver ion; DNA-metal interaction; Kelvin probe force microscope; Surface potential; Single droplet; LABEL-FREE; SENSOR; NANOSCALE; CYSTEINE;
D O I
10.1016/j.bios.2014.04.038
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
Nanotoxicity is receiving great importance due to its potential impact on human health and environment and due to rapid development in the field of nanoscale research and industry. Herein, we report the Kelvin probe force microscope (KPPM)-based nanotoxicity material detection using surface potential difference. In general, it is difficult to measure the size of ion (Ag+) using a conventional atomic force microscope (AFM) because of the limited resolution. In this study, we have demonstrated that KPFM is capable of ultra-sensitive detection of silver ion with silver specific DNA by a single droplet. Furthermore, the measured surface potentials for Ag+ and DNA binding enable the detection performance for a practical sample that is general drinking water. Remarkably, the KPFM based silver ion detection enables an insight into the coordination chemistry, which plays an important role in early detection of toxicity. This implies that KPFM based detection system opens a new avenue for water testing sensor. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:299 / 304
页数:6
相关论文
共 50 条
  • [41] The effect of patch potentials in Casimir force measurements determined by heterodyne Kelvin probe force microscopy
    Garrett, Joseph L.
    Somers, David
    Munday, Jeremy N.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2015, 27 (21) : 1 - 8
  • [42] Photothermal nano-cavities for ultra-sensitive chem-bio detection
    Hu, Juejun
    Musgraves, J. David
    Carlie, Nathan
    Agarwal, Anu
    Richardson, Kathleen
    Kimerling, Lionel C.
    CHEMICAL, BIOLOGICAL, RADIOLOGICAL, NUCLEAR, AND EXPLOSIVES (CBRNE) SENSING XII, 2011, 8018
  • [43] Kelvin probe force microscopy on InAs thin films on (110) GaAs substrates
    Takahashi, T
    Kawamukai, T
    Ono, S
    Noda, T
    Sakaki, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B): : 3721 - 3723
  • [44] Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy
    Umeda, K
    Kobayashi, K
    Ishida, K
    Hotta, S
    Yamada, H
    Matsushige, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B): : 4381 - 4383
  • [45] The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy
    Lee, N. J.
    Yoo, J. W.
    Choi, Y. J.
    Kang, C. J.
    Jeon, D. Y.
    Kim, D. C.
    Seo, S.
    Chung, H. J.
    APPLIED PHYSICS LETTERS, 2009, 95 (22)
  • [46] Doping transition of doped ZnO nanorods measured by Kelvin probe force microscopy
    Ben, Chu Van
    Cho, Hak Dong
    Kang, Tae Won
    Yang, Woochul
    THIN SOLID FILMS, 2012, 520 (14) : 4622 - 4625
  • [47] Insight into Al-Si interface of PERC by Kelvin probe force microscopy
    Wang, Xingbo
    Qian, Guoyu
    Gao, Zhou
    Jiang, Xing
    Chen, Yongji
    Liu, Jian
    Lin, Yuan
    Pan, Feng
    FUNCTIONAL MATERIALS LETTERS, 2019, 12 (05)
  • [48] High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
    Zhang, Hao
    Meng, Xianghe
    Song, Jianmin
    Geng, Junyuan
    Jin, Peng
    Xie, Hui
    IEEE ACCESS, 2019, 7 : 183906 - 183913
  • [49] Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface
    Collins, Liam
    Kilpatrick, Jason I.
    Vlassiouk, Ivan V.
    Tselev, Alexander
    Weber, Stefan A. L.
    Jesse, Stephen
    Kalinin, Sergei V.
    Rodriguez, Brian J.
    APPLIED PHYSICS LETTERS, 2014, 104 (13)
  • [50] Two-dimensional carrier profiling by Kelvin-probe force Microscopy
    Tsui, Bing-Yue
    Hsieh, Chih-Ming
    Su, Po-Chih
    Tzeng, Shien-Der
    Gwo, Shangjr
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (06) : 4448 - 4453