Compact Modeling of Organic Thin-Film Transistors with Solution Processed Octadecyl Substituted Tetrabenzotriazaporphyrin as an Active Layer

被引:14
作者
Jimenez Tejada, Juan A. [1 ]
Lopez Varo, Pilar [1 ]
Cammidge, Andrew N. [2 ]
Chambrier, Isabelle [2 ]
Cook, Michael J. [2 ]
Chaure, Nandu B. [3 ]
Ray, Asim K. [3 ]
机构
[1] Univ Granada, CITIC UGR, Dept Elect & Tecnol Comp, E-18071 Granada, Spain
[2] Univ East Anglia, Sch Chem, Norwich NR4 7TJ, Norfolk, England
[3] Queen Mary Univ London, Mat Res Ctr, London E1 4NS, England
关键词
Contact effects; device parameters; field effect; MOS; phthalocyanine; FIELD-EFFECT TRANSISTORS; PARAMETER EXTRACTION; SOLAR-CELLS; SEMICONDUCTORS;
D O I
10.1109/TED.2017.2690976
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using 70-nm-thick spin-coated film of newly synthesized octadecyl substituted copper tetrabenzotriaza-porphyrin (10CuTBTAP) as an active layer on a highly doped silicon (110) gate electrode substrates, output characteristics and transfer characteristics of bottom-gate bottom-contact organic thin-film transistors have been measured at room temperature. A compact model for thin-film transistors has been employed as a part of circuit design tool to extract device parameters, such as the charge-carrier mobility mu, the threshold voltage V-T, and the contact resistances. Parallel measurements and analysis were performed on similarly constructed devices with a copper phthalocyanine(10CuPc) analog. The results reveal that the 10CuPc layer is relatively more susceptible to trapping degradation near the gate region than a 10CuTBTAP layer, which is significant in order to achieve stability in these transistors. The application of the simple square law in the classical MOS model provides a quicker but approximate interpretation of the transistor performance without providing information on the gate-voltage dependence of mobility and the effects of the contact regions. In this paper, the analysis of the contact regions is found to be very important for determining the difference in the performance of two transistors.
引用
收藏
页码:2629 / 2634
页数:6
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