Nano-carbon pixels array for ionizing particles monitoring
被引:15
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作者:
Salvatori, S.
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Niccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, ItalyNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Salvatori, S.
[1
]
Oliva, P.
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机构:
Niccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Mediterranean Inst Fundamental Phys, Via Appia Nuova 31, I-00040 Rome, ItalyNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Oliva, P.
[1
,2
]
Pacilli, M.
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机构:
Univ Roma Tre, Dept Sci, Via Vasca Navale 84, I-00154 Rome, ItalyNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Pacilli, M.
[3
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Allegrini, P.
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机构:
Univ Roma Tre, Dept Sci, Via Vasca Navale 84, I-00154 Rome, ItalyNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Allegrini, P.
[3
]
Conte, G.
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Univ Roma Tre, Dept Sci, Via Vasca Navale 84, I-00154 Rome, ItalyNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Conte, G.
[3
]
Komlenok, M.
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Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, RussiaNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Komlenok, M.
[4
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Khomich, A. A.
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Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, RussiaNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Khomich, A. A.
[4
]
Bolshakov, A.
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Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, RussiaNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Bolshakov, A.
[4
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Ralchenko, V.
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Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, RussiaNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Ralchenko, V.
[4
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Konov, V.
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Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, RussiaNiccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
Konov, V.
[4
]
机构:
[1] Niccolo Cusano Univ, Via Don Carlo Gnocchi 3, I-00166 Rome, Italy
[2] Mediterranean Inst Fundamental Phys, Via Appia Nuova 31, I-00040 Rome, Italy
[3] Univ Roma Tre, Dept Sci, Via Vasca Navale 84, I-00154 Rome, Italy
[4] Russian Acad Sci, AM Prokhorov Gen Phys Inst, 38 Vavilova Str, Moscow 119991, Russia
The paper deals on the response of a polycrystalline diamond sensor, 500 pm thick, to particles from a Sr-90 beta-source. 21 x 21 nano-carbon pads, with 0.18 mm x 0.18 mm area each, were realized by ArF excimer laser irradiation on one diamond face, whereas a 7 x 7 mm(2) backside contact was fabricated and used for sensor biasing during characterization of sensor under beta-source irradiation. The carbon pads embrace a number of grains, which show different degrees of surface graphitization dependent on the grain orientations. Each carbon pad exhibits a linear I(V) response up to 200 V. The average number of charge carriers collected by a single pixel, as well as the distribution of pixels involved by the impinging particle tracking, is analyzed as a function of the applied voltage recording the signals acquired by 16 pixels at a time. The pulse height distribution is not affected by reversing the bias polarity. For a single pixel, the most probable collected charge value is 1.40 +/- 0.02 fC whereas the mean value gives < Q > (coll) = 1.67 +/- 0.02 fC (10,430 +/- 120 electrons). The charge collection distance was measured taking into account the effect induced by high-energy electrons and found to be 285 +/- 3 mu m, demonstrating the absence of bulk defects induced by the laser graphitization processing. Cross-talk effects between nearest neighbor pixels have been excluded analyzing the results obtained in a batch of more than 1000 events even if the same cannot be excluded under higher energy particles. (C) 2016 Elsevier B.V. All rights reserved.
机构:
UTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Nagoya Inst Technol, Showa Ku, Nagoya, Aichi 4668555, JapanUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Ikeda, Shoichiro
Kawasaki, Shinji
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机构:
Nagoya Inst Technol, Showa Ku, Nagoya, Aichi 4668555, JapanUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Kawasaki, Shinji
Nobumoto, Akinari
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机构:
Shion Co Ltd, Meito Ku, Nagoya, Aichi 4650058, JapanUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Nobumoto, Akinari
Ono, Hideo
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机构:
Shion Co Ltd, Meito Ku, Nagoya, Aichi 4650058, JapanUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Ono, Hideo
Ono, Shinji
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机构:
Shion Co Ltd, Meito Ku, Nagoya, Aichi 4650058, JapanUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Ono, Shinji
Rusop, Mohamad
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机构:
Univ Teknol MARA, Shah Alam 40450, Selangor, MalaysiaUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Rusop, Mohamad
Muhamad, Haji Muhazli B. Haji
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机构:
Sukimi Lube Sdn Bhd, Taman Perindustrian Saujana Indah, Shah Alam 4000, Selangor, MalaysiaUTM Kuala Lumpur, MJIIT, Kuala Lumpur 54100, Malaysia
Muhamad, Haji Muhazli B. Haji
NANOSCIENCE, NANOTECHNOLOGY AND NANOENGINEERING,
2014,
832
: 767
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机构:
Savitribai Phule Pune Univ, Dept Elect Sci, Pune 411007, Maharashtra, IndiaSavitribai Phule Pune Univ, Dept Elect Sci, Pune 411007, Maharashtra, India
Chinke, Shamal L.
Sandhu, Inderpal S.
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机构:
Def R&D Org, Terminal Ballist Res Lab, Dept Blast & Damage Studies, Chandigarh 160030, PS, IndiaSavitribai Phule Pune Univ, Dept Elect Sci, Pune 411007, Maharashtra, India
Sandhu, Inderpal S.
Alegaonkar, Prashant S.
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机构:
Cent Univ Punjab, Sch Basic Sci, Dept Phys, Guddha 151004, PS, IndiaSavitribai Phule Pune Univ, Dept Elect Sci, Pune 411007, Maharashtra, India