A model for electroelastic plates under biasing fields with applications in buckling analysis

This paper presents a theoretical model for coupled extension and flexure with shear deformations of an electroelastic plate under biasing fields. The governing equations of this model, defined in the middle plane of the plates, are derived from the full three-dimensional theory of electroelasticity for small fields superposed upon finite biasing fields, under the assumption that the stress component normal to the plate vanishes identically. As examples to illustrate the applications of this model, the authors include their analysis of buckling of three plates, one single-layered plate and two double-layered plates (i.e., bimorphs) of distinct poling configurations. This analysis indicates that the electromechanical coupling strengthens the plates against buckling. (C) 2002 Elsevier Science Ltd. All rights reserved.