Evaluation of local photoconductivity of solar cells by microwave near-field microscopy technique

被引：1

作者：

Hovsepyan, A. B. ^{[1
]}

机构：

[1] NAS Armenia, Inst Radiophys & Elect, Ashtarak, Armenia

来源：

JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES | 2009年 / 44卷 / 04期

关键词：

solar cell; local photoconductivity; surface layer; RESISTANCE;

D O I：

10.3103/S1068337209040045

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Local photoconductivity in surface layer of solar elements has been studied by the method of microwave near-field microscopy (MW NFM). Dependences of photoconductivity of a solar cell on the intensity and wavelength of the incident optical radiation are determined by measuring the coefficient of reflection of MW NFM resonator at the frequency 4.1 GHz.

引用

页码：174 / 177

页数：4

共 13 条

[1] Near-field scanning microwave probe based on a dielectric resonator [J].

Abu-Teir, M ;

Golosovsky, M ;

Davidov, D ;

Frenkel, A ;

Goldberger, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (04) :2073-2079

[2]

Brutting W., 2005, Physics of Organic Semiconductors

[3] Imaging microwave electric fields using a near-field scanning microwave microscope [J].

Dutta, SK ;

Vlahacos, CP ;

Steinhauer, DE ;

Thanawalla, AS ;

Feenstra, BJ ;

Wellstood, FC ;

Anlage, SM ;

Newman, HS .

APPLIED PHYSICS LETTERS, 1999, 74 (01) :156-158

[4] Spatially resolved measurements of HTS microwave surface impedence [J].

Hao, L ;

Gallop, JC .

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) :1944-1947

[5] Characterization of Alq3 thin films by a near-field microwave microprobe [J].

Hovsepyan, Artur ;

Lee, Huneung ;

Sarpyan, Tigran ;

Melikyan, Harutyun ;

Yoon, Youngwoon ;

Babajanyan, Arsen ;

Friedman, Barry ;

Lee, Kiejin .

ULTRAMICROSCOPY, 2008, 108 (10) :1058-1061

[6] Development of a near-field scanning microwave microscope using a tunable resonance cavity for high resolution [J].

Kim, J ;

Kim, MS ;

Lee, K ;

Lee, J ;

Cha, DJ ;

Friedman, B .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (01) :7-12

[7] Comparative study of electroluminescence from Cu(In,Ga)Se2 and Si solar cells [J].

Kirchartz, T. ;

Rau, U. ;

Kurth, M. ;

Mattheis, J. ;

Werner, J. H. .

THIN SOLID FILMS, 2007, 515 (15) :6238-6242

[8] Contrast of microwave near-field microscopy [J].

Knoll, B ;

Keilmann, F ;

Kramer, A ;

Guckenberger, R .

APPLIED PHYSICS LETTERS, 1997, 70 (20) :2667-2669

[9] Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers [J].

Lann, AF ;

Golosovsky, M ;

Davidov, D ;

Frenkel, A .

APPLIED PHYSICS LETTERS, 1998, 73 (19) :2832-2834

[10]

Pozar DM, 1990, Microwave Engineering, V4th

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