Distance dependence of mean-square relative displacements in EXAFS

被引:12
|
作者
Sapelkin, AV [1 ]
Bayliss, SC [1 ]
机构
[1] De Montfort Univ, Dept Chem, Solid State Res Ctr, Leicester LE1 9BH, Leics, England
来源
PHYSICAL REVIEW B | 2002年 / 65卷 / 17期
关键词
D O I
10.1103/PhysRevB.65.172104
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the sensitivity of extended x-ray-absorption fine structure (EXAFS) to the local atomic dynamics beyond the first shell in several elements (Ge, Cu, Ni) and binary compounds (ZnS and GaSb) at low temperature (12 K and 80 K). Debye-Waller factors were extracted up to the tenth shell in some cases allowing for a comprehensive experimental investigation of the distance dependence of the mean-square relative displacement. We demonstrate that the observed distance dependencies cannot be satisfactorily described by commonly used theoretical models. The origins of these discrepancies and the importance of long-range EXAFS information are discussed.
引用
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页码:1 / 4
页数:4
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