Nano-scale characterization of oxide materials

被引:2
|
作者
Klie, RF [1 ]
Browning, ND [1 ]
机构
[1] Univ Illinois, Dept Phys, Chicago, IL 60680 USA
关键词
EELS; grain boundary; heterogeneous catalyst; metal-oxide interaction; STEM; vacancy ordering; Z-contrast Imaging;
D O I
10.4028/www.scientific.net/DDF.206-207.31
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Oxygen vacancies are known to dominate the overall behavior of the bulk as well as at homo- and hetero-interfaces in oxide materials. In this report, the latest developments in analytical scanning transmission electron microscopy will be described that can be used to analyze the vacancy induced structure-property relationships in oxides, both at room and elevated temperatures. We will discuss the influence of vacancy ordering on ionic conductivity in bulk perovskite oxides. Further, the behavior of oxygen vacancies at grain-boundaries and at metal-oxide interfaces during in-situ reduction will be described. We will show that the combination of Z-contrast imaging, electron energy loss spectroscopy and in-situ reduction provides an experimental tool with unparalleled spatial resolution, energy resolution and chemical sensitivity to investigate the atomic scale vacancy dynamics in oxides.
引用
收藏
页码:31 / 52
页数:22
相关论文
共 50 条
  • [31] A study on the microstructure of nano-scale ceramic tool materials
    Zou, B
    Huang, CZ
    Liu, HL
    Wang, SL
    ADVANCES IN MATERIALS MANUFACTURING SCIENCE AND TECHNOLOGY, 2004, 471-472 : 260 - 263
  • [32] Synthesis and characterization of nano-scale electrochemical sensors.
    Andreu, A
    El-Kouedi, M
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 228 : U806 - U806
  • [33] Design, Fabrication and Characterization of Nano-scale Plasmonic Networks
    Swillam, Mohamed A.
    Lau, Bendict
    Lin, Charles
    Helmy, Amr. S.
    PHOTONICS NORTH 2011, 2011, 8007
  • [34] Nano-scale Characterization of the Dynamics of the Chloroplast Toc Translocon
    Reddick, L. Evan
    Chotewutmontri, Prakitchai
    Crenshaw, Will
    Dave, Ashita
    Vaughn, Michael
    Bruce, Barry D.
    METHODS IN NANO CELL BIOLOGY, 2008, 90 : 365 - +
  • [35] Nano-scale Characterization of Insulator-semicon Contacts
    Gullo, F.
    Villeneuve-Faure, C.
    Le Roy, S.
    Laurent, C.
    Teyssedre, G.
    Christen, T.
    Torkvist, C.
    Hillborg, H.
    2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2, 2016, : 792 - 795
  • [36] Linearity Characterization of Nano-Scale Underlap SOI MOSFETs
    Singh, Indra Vijay
    Alam, M. S.
    2013 ANNUAL IEEE INDIA CONFERENCE (INDICON), 2013,
  • [37] Industrial characterization of nano-scale roughness on polished surfaces
    Feidenhans'l, Nikolaj A.
    Hansen, Poul-Erik
    Pilny, Lukas
    Madsen, Morten H.
    Bissacco, Giuliano
    Petersen, Jan C.
    Taboryski, Rafael
    OPTIFAB 2015, 2015, 9633
  • [38] Nano-scale wear characterization of CoCrMo biomedical alloys
    Martinez-Nogues, V.
    Nesbitt, J. M.
    Wood, R. J. K.
    Cook, R. B.
    TRIBOLOGY INTERNATIONAL, 2016, 93 : 563 - 572
  • [39] Near-Field Microwave Techniques for Micro- and Nano-Scale Characterization in Materials Science
    Marcelli, Romolo
    Lucibello, Andrea
    Capoccia, Giovanni
    Proietti, Emanuela
    Sardi, Giovanni Maria
    Christopher, Hardly Joseph
    Michalas, Loukas
    Bartolucci, Giancarlo
    Kienberger, Ferry
    Gramse, Georg
    Kasper, Manuel
    2017 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS), 40TH EDITION, 2017, : 29 - 36
  • [40] Tortuosity characterization of 3D microstructure at nano-scale for energy storage and conversion materials
    Chen-Wiegart, Yu-chen Karen
    DeMike, Ross
    Erdonmez, Can
    Thornton, Katsuyo
    Barnett, Scott A.
    Wang, Jun
    JOURNAL OF POWER SOURCES, 2014, 249 : 349 - 356