Defects in AlSb: A density functional study

被引:16
作者
Du, Mao-Hua [1 ,2 ]
机构
[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA
[2] Oak Ridge Natl Lab, Ctr Radiat Detect Mat & Syst, Oak Ridge, TN 37831 USA
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 04期
关键词
aluminium compounds; antisite defects; density functional theory; electron traps; Fermi level; III-V semiconductors; impurities; metastable states; V SEMICONDUCTORS; DONOR LEVELS; GAAS;
D O I
10.1103/PhysRevB.79.045207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We carry out density functional calculations to study both intrinsic and extrinsic defects in AlSb. We focus on the carrier compensation and trapping properties of these defects, which are important to the radiation detection applications. We show that the Sb antisite (Sb(Al)) is a low-energy defect, with interesting property of light-induced metastability, similar to the As antisite in GaAs. Sb(Al) is effective in compensating holes induced by the residual carbon but is also a deep electron trap that reduces the carrier drifting length. We discuss the possibility of using hydrogenated isovalent N impurity in AlSb and GaAs to pin the Fermi level without causing efficient carrier trapping.
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页数:7
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