Short range ordering in amorphous In-Se films by wide-angle X-ray scattering

Wide-angle X-ray scattering studies were performed on In-Se amorphous films, obtained by thermal evaporation, with selenium content of 60 and 66 at.%. The intensities were recorded in the scattering vector range between 3 and 160 nm(-1). Structural information about the local structure of the amorphous In-Se films has been derived from the radial distribution function using the curve-fitting method. The experimental results have been compared with model based simulations. The obtained structural parameters indicate that for In40Se60 In-In, In-Se and Se-Se contributions are involved in the near-neighbour coordination sphere. As the Se content is increased, the number of In-In bonds is reduced to zero, within the precision of the method. For both amorphous films In is tetrahedrally coordinated while Se has three near neighbours on the average. (C) 2000 Kluwer Academic Publishers.