Domain imaging of mesoscopic magnetic structures by photoelectron emission microscopy

被引:5
|
作者
Kiwata, H
Kihara, T
Ono, K
Oshima, M
Okuda, T
Harasawa, A
Kinoshita, T
Yokoo, A
机构
[1] Univ Tokyo, Grad Sch Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Univ Tokyo, Inst Solid State Phys, Tokyo 2778581, Japan
关键词
D O I
10.1142/S0218625X02002336
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have observed magnetic domains of mesoscopic magnetic structures of Ni by synchrotron radiation photoelectron emission microscopy using circularly polarized soft X-rays from the bending magnet. The mesoscopic magnetic structures of Ni were fabricated by electron beam lithography combined with a chemical liftoff process. The geometries of the Ni mesoscopic samples were square, triangular and hexagonal with the sizes of 5 and 10 mum. The magnetic domains structures were clearly observed by dividing the images measured at the Ni L-3-edge by the images measured at the Ni L-2-edge. The magnetic domains of the Ni mesoscopic structures are discussed with the results of magnetic force microscopy and micromagnetic simulation.
引用
收藏
页码:365 / 369
页数:5
相关论文
共 50 条
  • [31] Observation of magnetic domain structures of magnetic thin films by the Lorentz electron microscopy
    Okada, A
    Chimura, M
    Hamada, K
    Arita, M
    Ishida, I
    JOURNAL OF UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING, 1999, 6 (02): : 119 - 124
  • [33] Imaging of magnetic domain structures using optical techniques
    Dickson, W
    Takahashi, S
    Pollard, R
    Atkinson, R
    Zayats, AV
    NANOTECHNOLOGY, 2003, 5118 : 602 - 612
  • [34] MAGNETIC FORCE MICROSCOPY IMAGING OF DOMAIN-WALLS IN MAGNETITE
    WILLIAMS, W
    HOFFMANN, V
    HEIDER, F
    GODDENHENRICH, T
    HEIDEN, C
    GEOPHYSICAL JOURNAL INTERNATIONAL, 1992, 111 (03) : 417 - 423
  • [35] Ferroelastic control of magnetic domain structure: Direct imaging by magnetic force microscopy
    Seddon, S. D.
    Haines, C. R. S.
    Hase, T. P. A.
    Lees, M. R.
    Eng, L. M.
    Alexe, M.
    Carpenter, M. A.
    PHYSICAL REVIEW B, 2024, 110 (06)
  • [36] Characterizing voltage contrast in photoelectron emission microscopy
    Sangwan, V. K.
    Ballarotto, V. W.
    Siegrist, K.
    Williams, E. D.
    JOURNAL OF MICROSCOPY, 2010, 238 (03) : 210 - 217
  • [37] PHOTOELECTRON EMISSION MICROSCOPY OF WORK FUNCTION CHANGES
    BETHGE, H
    KLAUA, M
    ULTRAMICROSCOPY, 1983, 11 (2-3) : 207 - 213
  • [38] Artefact formation in scanning photoelectron emission microscopy
    Günther, S
    Kolmakov, A
    Kovac, J
    Kiskinova, M
    ULTRAMICROSCOPY, 1998, 75 (01) : 35 - 51
  • [39] Artefact formation in scanning photoelectron emission microscopy
    Sincrotrone Trieste, Science Area Park, Basovizza, 34012 Trieste, Italy
    不详
    不详
    Ultramicroscopy, 1 (35-51):
  • [40] Single molecule measurements with photoelectron emission microscopy
    Kong, Xianhua
    Rowe, J. E.
    Nemanich, R. J.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2008, 26 (04): : 1461 - 1465