Melting of indium by temperature-modulated differential scanning calorimetry

被引:33
作者
Ishikiriyama, K
Boller, A
Wunderlich, B
机构
[1] UNIV TENNESSEE,DEPT CHEM,KNOXVILLE,TN 37996
[2] OAK RIDGE NATL LAB,DIV CHEM & ANALYT SCI,OAK RIDGE,TN 37831
来源
JOURNAL OF THERMAL ANALYSIS | 1997年 / 50卷 / 04期
关键词
indium; melting; temperature calibration; TMDSC;
D O I
10.1007/BF01979027
中图分类号
O414.1 [热力学];
学科分类号
摘要
The melting and crystallization of a sharply melting standard has been explored for the calibration of temperature-modulated differential scanning calorimetry, TMDSC. Modulated temperature and heat flow have been followed during melting and crystallization of indium. It is observed that indium does not supercool as long as crystal nuclei remain in the sample when analyzing quasi-isothermally with a small modulation amplitude. For standard differential scanning calorimetry, DSC, the melting and crystallization temperatures of indium are sufficiently different not to permit its use for calibration on cooling, unless special analysis modes are applied. For TMDSC with an underlying heating rate of 0.2 K min(-1) and a modulation amplitude of 0.5-1.5 K at periods of 30-90 s, the extrapolated onsets of melting and freezing were within 0.1 K of the known melting temperature of indium. Further work is needed to separate the effects originating from loss of steady state between sample and sensor on the one hand and from supercooling on the other.
引用
收藏
页码:547 / 558
页数:12
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