Modification of a YBa2Cu3O7-δ thin film using an atomic force microscope

被引：3
作者：
You, LX [1 ]
Yin, XB
Feng, YJ
Yang, SZ
Kang, L
Wang, M
Wu, PH
机构：
[1] Nanjing Univ, Res Inst Superconductor Elect, Dept Elect Sci & Engn, Nanjing 210093, Peoples R China
[2] Nanjing Univ, State Key Lab Solid State Microstruct, Dept Phys, Nanjing 210093, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2002年 / 19卷 / 06期
关键词：
D O I：
10.1088/0256-307X/19/6/333
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A YBa2Cu3O7-delta thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with the operation parameters of the bias voltage, the moving velocity of the probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossing the ridge.
引用
收藏
页码：854 / 856
页数：3
相关论文
共 23 条
  • [1] Nanometer-scale surface modifications of YBa2Cu3O7-delta thin films using a scanning tunneling microscope
    Bertsche, G
    Clauss, W
    Kern, DP
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (25) : 3632 - 3634
  • [2] Investigation of the modification mechanism induced by a scanning tunneling microscope on YBa2Cu3O7-δ
    Bertsche, G
    Clauss, W
    Prins, FE
    Kern, DP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (05): : 2833 - 2836
  • [3] BERTSCHE G, 1998, J VAC SCI TECHNOL B, V16, P3833
  • [4] Scanning probe nanostructuring of YBa2Cu3O7:: A corrosion induced abrasion
    Boneberg, J
    Bohmisch, M
    Ochmann, M
    Leiderer, P
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (26) : 3805 - 3807
  • [5] MODIFICATION OF HYDROGEN-PASSIVATED SILICON BY A SCANNING TUNNELING MICROSCOPE OPERATING IN AIR
    DAGATA, JA
    SCHNEIR, J
    HARARY, HH
    EVANS, CJ
    POSTEK, MT
    BENNETT, J
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (20) : 2001 - 2003
  • [6] SURFACE MODIFICATION DURING SCANNING TUNNELING MICROSCOPE MEASUREMENTS ON YBA2CU3O7 THIN-FILMS
    GEYER, U
    VONMINNIGERODE, G
    KREBS, HU
    [J]. JOURNAL OF APPLIED PHYSICS, 1994, 76 (12) : 7774 - 7777
  • [7] SCANNING TUNNELING MICROSCOPY OF THE SURFACE-TOPOGRAPHY AND SURFACE ETCHING OF NANOSCALE STRUCTURES ON THE HIGH-TEMPERATURE SUPERCONDUCTORS
    HARMER, MA
    FINCHER, CR
    PARKINSON, BA
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 70 (05) : 2760 - 2763
  • [8] FABRICATION OF NANOMETER-SCALE STRUCTURES USING ATOMIC-FORCE MICROSCOPE WITH CONDUCTING PROBE
    HATTORI, T
    EJIRI, Y
    SAITO, K
    YASUTAKE, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1994, 12 (04): : 2586 - 2590
  • [9] TOPOGRAPHY AND LOCAL MODIFICATION OF THE HOBA2CU3O7-X(001) SURFACE USING SCANNING TUNNELING MICROSCOPY
    HEINZELMANN, H
    ANSELMETTI, D
    WIESENDANGER, R
    GUNTHERODT, HJ
    KALDIS, E
    WISARD, A
    [J]. APPLIED PHYSICS LETTERS, 1988, 53 (24) : 2447 - 2449
  • [10] ETCHING OF SCREW DISLOCATIONS IN YBA2CU3O7 FILMS WITH A SCANNING TUNNELING MICROSCOPE
    HEYVAERT, I
    OSQUIGUIL, E
    VANHAESENDONCK, C
    BRUYNSERAEDE, Y
    [J]. APPLIED PHYSICS LETTERS, 1992, 61 (01) : 111 - 113
123